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Displaying 1-9 of 9 results for author "Buehler, Martin G."
Design and qualification of the SEU/TD radiation monitor chip [microform] / Martin G. Buehler ... [et al.].
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1992]
- 1992
Solid state radiation dosimeters for space and medical applications [microform] / Martin G. Buehler, editor.
- Text
- Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
- 1996
A FORTRAN program for analysis of data from microelectronic test structures / Richard L. Mattis, Martin G. Buehler.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1983.
- 1983
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo97595Microelectronic test patterns / Martin G. Buehler.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1974.
- 1974
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo96557A BASIC program for calculating dopant density profiles from capacitance-voltage data / Richard L. Mattis and Martin G. Buehler.
- Text
- Washington : U.S. Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .M375 Off-site Planar test structures for characterizing impurities in silicon / M. G. Buehler [and others] ; Electronic Technology Division.
- Text
- Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-21 Off-site Microelectronic test pattern NBS-4 / W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology.
- Text
- Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-32 Off-site A wafer chuck for use between -196 and 350C̊ / R. Y. Koyama and M. G. Beuhler, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
- Text
- Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-55 Off-site Solid state radiation dosimeters for space and medical applications / Martin G. Buehler, editor.
- Text
- Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, 1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text QC795.32.R3 S644 1996 Off-site
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