Research Catalog

  • Modern optical characterization techniques for semiconductors and semiconductor devices : 26-27 March 1987, Bay Point, Florida / O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1987], ©1987.
    • 1987-1987
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .M58 1987gOff-site
  • Modern optical characterization techniques for semiconductors and semiconductor devices / O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text TK7872.T55 M63 1987Off-site
  • Modern optical characterization techniques for semiconductors and semiconductor devices / O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text TK7872.T55 M63 1987Off-site

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