Research Catalog

  • A FORTRAN program for calculating the electrical parameters of extrinsic silicon / R. D. Larrabee, W. R. Thurber, W. Murray Bullis.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1980.
    • 1980
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo105252
  • Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites / D. G. Seiler, J. R. Lowney, W. R. Thurber, J. J. Kopanski, G. G. Harman.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1994.
    • 1994
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo97991
  • A FORTRAN program for calculating the electrical parameters of extrinsic silicon / R. D. Larrabee, W. R. Thurber, and W. M. Bullis.

    • Text
    • Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-63Off-site
  • The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon / W.R. Thurber [and others].

    • Text
    • Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-64Off-site
  • The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon / W.R. Thurber ... [et al.].

    • Text
    • Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., [1981]
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-64Off-site
  • A FORTRAN program for calculating the electrical parameters of extrinsic silicon / R.D. Larrabee, W.R. Thurber, and W.M. Bullis.

    • Text
    • Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:P400-63Off-site
  • The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon / W.R. Thurber ... [et al.].

    • Text
    • Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., [1981]
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-64Off-site
  • A FORTRAN program for calculating the electrical parameters of extrinsic silicon / R.D. Larrabee, W.R. Thurber, and W.M. Bullis.

    • Text
    • Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:P400-63Off-site

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