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Displaying 1-4 of 4 results for author "Watkins, George D."
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
- Text
- Pittsburgh, Pa. : Materials Research Society, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSE 86-417 Offsite Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
- Text
- Pittsburgh, Pa. : Materials Research Society, [1985], ©1985.
- 1985-1985
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .M53 1985 Off-site Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
- Text
- Pittsburgh, Pa. : Materials Research Society, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .M53 1985 Off-site Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
- Text
- Pittsburgh, Pa. : Materials Research Society, ©1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .M53 1985 Off-site
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