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Displaying 1-5 of 5 results for author "Zorian, Yervant."
Principles of testing electronic systems / Samiha Mourad, Yervant Zorian.
- Text
- New York : John Wiley & Sons, 2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Text JSE 00-2095 Offsite Embedded processor-based self-test / by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian.
- Text
- Boston ; London : Kluwer Academic Publishers, c2004.
- 2004
- 1 Item
Item details Format Call Number Item Location Text JSE 05-450 Offsite On-line testing for VLSI / edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan.
- Text
- Boston : Kluwer Academic Publishers, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7867 .O5 1998 Off-site Proceedings : 2001 IEEE International Workshop on Memory Technology, Design and Testing : August 6-7, 2001, San Jose, California, USA / editors, Yervant Zorian [and others] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
- Text
- Los Alamitos, California : IEEE Computer Society, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 2001g Off-site Memory technology, design and testing : proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France / editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
- Text
- Los Alamitos, California : IEEE Computer Society, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 2002g Off-site
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