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Displaying 1-3 of 3 results for author "Carver, G. P."
Double-level metallization [microform] : annual report for October 1, 1985 to September 30, 1986 / G.P. Carver ... [et al.].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Bureau of Standards, National Engineering Laboratory, Center for Electronics and Electrical Engineering, Semiconductor Electronics Division, [1987]
- 1987
A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.
- Text
- Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-68 Off-site A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.
- Text
- Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-68 Off-site
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