Research Catalog

  • Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.

    • Text
    • Boston : Kluwer Academic Publishers, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 90-764Offsite
  • Testing of digital systems / N.K. Jha and S. Gupta.

    • Text
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874.65 .J48 2003gOff-site
  • Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.

    • Text
    • Boston : Kluwer Academic Publishers, [1990], ©1990.
    • 1990-1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.99.M44 J49 1990Off-site
  • Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.

    • Text
    • Boston : Kluwer Academic Publishers, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.99.M44 J49 1990Off-site
  • Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.

    • Text
    • Boston : Kluwer Academic Publishers, ©1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.99.M44 J49 1990Off-site

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