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Displaying 1-3 of 3 results for author "National Semiconductor Metrology Program (U.S.)"
Project portfolio [microform]
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996-
- 1996-present
- 1 Item
Item details Format Call Number Item Location Text Check with Staff Not available - Please for assistance.National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].
- Text
- Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-
- 1995-present
- 6 Items
Item details Format Call Number Item Location Text C 13.37:103/ 1998 Off-site Item details Format Call Number Item Location Text C 13.37:103/ 1999 Off-site Item details Format Call Number Item Location Text C 13.37:103/ 2000 Off-site National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-
- 1995-present
- 2 Items
Item details Format Call Number Item Location Text C 13.37:103 1998 Off-site Item details Format Call Number Item Location Text C 13.37:103 2000 Off-site
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