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Displaying 1-26 of 26 results
Critical phenomena at surfaces and interfaces : evanescent X-ray and neutro scattering / Helmut Dosch.
- Text
- Berlin ; New York : Springer-Verlag, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text JSE 92-1317 Offsite Development of a measurement of upper mid frequency errors on arbitrary grazing incidence topics [microform] : NASA SBIR phase II, final report, contract NAS5-30311 / author, principal investigator, Paul Glenn.
- Text
- Wellesley, MA : Bauer Associates, inc., Electro-optical Systems ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1990]
- 1990
Backscatter from a periodic rough surface at near grazing incidence [microform] / A.K. Dominek and H.T. Shamansky.
- Text
- Columbus, Ohio : Ohio State University ; Hampton, VA : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1987]
- 1987
Software to model AXAF-I image quality [microform] : final report / prepared by Anees Ahmad and Chen Feng.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
- 1995
F/NAS/UAH/replicated/composite optics development [microform] : final report ... NAS8-38609 ... / form Darell Engelhaupt, William Jones, M. Mendrek.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
- 1997
Fabrication of the Advanced X-ray Astrophysics Facility (AXAF) optics [microform] : a deterministic, precision engineering approach to optical fabrication / T.E. Gordon.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
- 1995
Characterization and application of a grazing angle objective for quantitative infrared reflection microspectroscopy [microform] / Stephen V. Pepper.
- Text
- [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
- 1995
Test method for telescopes using a point source at a finite distance [microform] : MSFC Center director's discretionary fund final report, project no. H20 / by Donald B. Griner, David E. Zissa, and Dietrich Korsch.
- Text
- [Marshall Space Flight Center, Ala.?] : National Aeronautics and Space Administration, George C. Marshall Space Flight Center, [1985]
- 1985
Multilayer and grazing incidence X-ray/EUV optics : 22-24 July 1991, San Diego, California / Richard B. Hoover, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : The Society, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text QB472.A1 M85 1992 Off-site Critical phenomena at surfaces and interfaces : evanescent X-ray and neutro scattering / Helmut Dosch.
- Text
- Berlin ; New York : Springer-Verlag, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text 508 Er38 v.126 Off-site Multilayer and grazing incidence x-ray/EUV optics for astronomy and projection lithography : 19-22 July 1992, San Diego, California / Richard B. Hoover, Arthur B.C. Walker, chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text QC437 .M85 1993g Off-site Multilayer and grazing incidence X-ray/EUV optics II : 14-16 July 1993, San Diego, California / Richard B. Hoover, Arthur B.C. Walker, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text QB471.A1 M85 1993g Off-site Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado / Richard B. Hoover, Arthur B.C. Walker, Jr., chair/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : The Society, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text QB472.A1 M85 1996 Off-site Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California / Richard B. Hoover, Arthur B.C. Walker II, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TA1775 .G73 1997g Off-site Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado / Richard B. Hoover, Arthur B.C. Walker, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : The Society, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2805 Off-site Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California / Richard B. Hoover, Arthur B.C. Walker II, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.3113 Off-site The Paraboloid-paraboloid microscopic optical X-ray system : first experience / R. Hudec ... [et al.]. X-ray optical properties of galvanoplastic grazing incidence mirrors / R. Hudec ... [et al.].
- Text
- 1987-present
- 1 Item
Item details Format Call Number Item Location Text 8441.6.62 no. 64 no. 64 Off-site Wolter 1 type x-ray mirror system with mean resolution and maximum effective collecting area for the spectral region of 1 - 10 nm. / R. Hudec...[et al.]. Galvanoplastic grazing incidence mirrors for "vertical" experiments : the tandem tests in soft x-rays / R. Hudec...[et al.].
- Text
- Ondřejov, Czechoslovakia : Astronomical Institute of the Czechoslovak Academy of Sciences, 1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text 8441.6.62 no. 61 no. 61 Off-site Critical phenomena at surfaces and interfaces : evanascent x-ray and neutron scattering / Helmut Dosch.
- Text
- 1992
- 1 Item
Item details Format Call Number Item Location Text Q111 .E7 vol.126 Off-site Advances in multilayer and grazing incidence X-ray/EUV/FUV optics : 24-26 July 1994, San Diego, California / Richard B. Hoover, Arthur B.C. Walker, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- 1994
- 1 Item
Item details Format Call Number Item Location Text TA1775 .M8483 1994 Off-site Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado / Richard B. Hoover, Arthur B.C. Walker, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : The Society, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2805 Off-site Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California / Richard B. Hoover, Arthur B.C. Walker II, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.3113 Off-site The Paraboloid-paraboloid microscopic optical X-ray system : first experience / R. Hudec ... [et al.]. X-ray optical properties of galvanoplastic grazing incidence mirrors / R. Hudec ... [et al.].
- Text
- Ondřejov, Czechoslovakia : Astronomical Institute of the Czechoslovak Academy of Sciences, 1987-
- 1987-present
- 1 Item
Item details Format Call Number Item Location Text 8441.6.62 no. 64 no. 64 Off-site X-ray/EUV optics for astronomy and microscopy : 7-11 August 1989 / Richard B. Hoover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University [and others].
- Text
- Bellingham, Wash. : SPIE, ©1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text QB472 .X72 Off-site Critical phenomena at surfaces and interfaces : evanescent X-ray and neutron scattering / Helmut Dosch.
- Text
- Berlin ; New York : Springer-Verlag, ©1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text Q111 .E7 vol.126 Off-site Advances in multilayer and grazing incidence X-ray/EUV/FUV optics : 24-26 July 1994, San Diego, California / Richard B. Hoover, Arthur B.C. Walker, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Text TA1775 .M8483 1994 Off-site
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