Research Catalog
New! Try our Article Search to discover online journals, books, and more from home with your library card.
Displaying 1-5 of 5 results
Introduction to IDDQ testing / by Sreejit Chakravarty and Paul J. Thadikaran.
- Text
- Boston : Kluwer Academic Publishers, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text JSE 97-1263 Offsite Iddq testing for CMOS VLSI / Rochit Rajsuman.
- Text
- Boston : Artech House, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.M44 R35 1995 Off-site Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, DC / edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.M44 I34 1996g Off-site IDDQ testing : digest of papers : IEEE International Workshop on IDDQ Testing, November 5-6, 1997, Washington, D.C. / edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.M44 I34 1997g Off-site 2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings / sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon.
- Text
- Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.M44 I34 1999g Off-site
No results found from Digital Research Books Beta
Digital books for research from multiple sources world wide- all free to read, download, and keep. No Library Card is Required. Read more about the project.
