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Displaying 1-50 of 93 results
Data entry without keypunching : improved preparation for social-data analysis / Martin D. Sorin.
- Text
- Lexington, Mass. : LexingtonBooks, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text JLE 82-333|m(SASB) Offsite Electro-optic and acousto-optic scanning and deflection / Milton Gottlieb, Clive L.M. Ireland, John Martin Ley.
- Text
- New York : M. Dekker, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSE 87-1251 Offsite Laser beam scanning : opto-mechanical devices, systems, and data storage optics / edited by Gerald F. Marshall.
- Text
- New York, N.Y. : Marcel Dekker, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSE 87-1200 Offsite Selected papers on laser scanning and recording / Leo Beiser, editor.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSF 90-688 Offsite The scanner handbook : a complete guide to the use and applications of desktop scanners / Stephen Beale, James Cavuoto.
- Text
- Oxford : Heinemann Newtech, 1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text JSE 91-644 Offsite Datapro reports on document imaging systems : product evaluations, user perspectives, management issues.
- Text
- Delran, N.J. : Datapro Information Services Group ; McGraw-Hill, 1991-
- 1991-present
- 2 Items
Item details Format Call Number Item Location Text JSF 91-1071 v. 1 Offsite Item details Format Call Number Item Location Text JSF 91-1071 v. 2 Offsite Expert systems for scanner data environments : the marketing workbench laboratory experience / John M. McCann, John P. Gallagher.
- Text
- Boston : Kluwer Academic Publishers, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text JBE 92-1468 Offsite Optical scanning / edited by Gerald F. Marshall.
- Text
- New York : Marcel Dekker, Inc., c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text JSE 93-307 Offsite Introduction to electronic document management systems / William B. Green.
- Text
- Boston : Academic Press, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSE 93-1750 Offsite Optical scanning for the business man, by Ralph Dyer [and others]
- Text
- New York, Hobbs, Dorman [1966]
- 1966
- 1 Item
Item details Format Call Number Item Location Text OEO (Dyer, R. Optical scanning for the business man) 1966 Offsite Visual information retrieval / Alberto Del Bimbo.
- Text
- San Francisco, CA : Morgan Kaufmann Publishers, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSE 99-1770 Offsite Laser tracking and tram control of a continuous mining machine / by Donna L. Anderson.
- Text
- Washington, D.C. (2401 E St., N.W., MS #9800, Washington 20241) : U.S. Dept. of the Interior, Bureau of Mines, 1990.
- 1990
A laser-based continuous miner guidance system / by Donna L. Anderson and John S. Gbruoski.
- Text
- Washington, D.C. (2401 E St., NW, MS #9800, Washington, 20241-0001) : U.S. Dept. of the Interior, Bureau of Mines, 1991.
- 1991
Optical techniques for shock visualization and detection [microform] / G. Adamovsky and D.K. Johnson.
- Text
- [Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
- 1995
Principles of visual information retrieval / Michael S. Lew, ed.
- Text
- London ; New York : Springer, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text JSE 02-463 Offsite Machine interpretation of line drawing images : technical drawings, maps, and diagrams / Sergey Ablameyko and Tony Pridmore.
- Text
- London ; New York : Springer, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Text JSE 02-673 Offsite Real world scanning and halftones : the definitive guide to scanning and halftones from the desktop / by David Blatner and Steve Roth.
- Text
- Berkeley, Calif : Peachpit Press, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSD 04-14 Offsite Calibration experiments of a laser scanner [microform] / Geraldine S. Cheok, Stefan Leigh, Andrew Rukhin.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
- 2002
Handbook of optical and laser scanning / edited by Gerald F. Marshall.
- Text
- New York : Marcel Dekker, c2004.
- 2004
- 1 Item
Item details Format Call Number Item Location Text JSF 04-594 Offsite Scanning services for library users / Tom Caswell , LeiLani Freund.
- Text
- Washington, D.C. : Association of Research Libraries, Office of Leadership and Management Services, c2005.
- 2005
- 1 Item
Item details Format Call Number Item Location Text JFF 05-2511 Schwarzman Building - Main Reading Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Development of techniques required for the application of a laser to three dimensional visual sensing [microform] / by Arthur M. Ryan and Lester A. Gerhardt.
- Text
- Troy, N.Y. : Center for Intelligent Robotic Systems for Space Exploration, Rensselaer Polytechnic Institute ; [Washington, D.C. : National Aeronautics and Space Administration, 1991]
- 1991
Application of a laser scanner to three dimensional visual sensing tasks / by Arthur M. Ryan.
- Text
- Troy, New York : Rensselaer Polytechnic Institute, Electrical, Computer, and Systems Engineering Department, May 1992.
- 1992-5
Scanners frolics / Baptiste Rabichon.
- Text
- [Paris] : RRose Editions, 2015.
- 2015
- 1 Item
Item details Format Call Number Item Location Text MEMZ (Rabichon) 18-1919 Schwarzman Building - Print Collection Room 308 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Development of 3-D ice accretion measurement method / Sam Lee [and four others].
- Text
- Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, 2012.
- 2012
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo33969Application of a laser scanner to three dimensional visual sensing tasks / by Arthur M. Ryan.
- Text
- Troy, New York : Rensselaer Polytechnic Institute, Electrical, Computer, and Systems Engineering Department, May 1992.
- 1992-5
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo51987Optical time-domain reflectometer performance and calibration studies / B. L. Danielson.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1983.
- 1983
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo103677Optical time-domain reflectometer performance and calibration studies / B.L. Danielson.
- Text
- Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1983.
- 1983
Cameras, scanners, and image acquisition systems : 3-4 February 1993, San Jose, California / Helen C. Marz, Robert L. Nielsen, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK8315 .C248 1993 Off-site Recording systems : high-resolution cameras and recording devices, laser scanning and recording systems : 21-23 June 1993, Munich, FRG / Leo Beiser, Reimar K. Lenz, chairs/editors ; sponsored by European Optical Society, SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology.
- Text
- Bellingham, Wash., USA : SPIE, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK8315 .R436 1993g Off-site Micro-optics/micromechanics and laser scanning and shaping : 7-9 February 1995, San Jose, California / M. Edward Motamedi, Leo Beiser, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TA1660 .M558 1995g Off-site Miniaturized systems with micro-optics and micromechanics : 30-31 January 1996, San Jose, California / M. Edward Motamedi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization ARPA--Advanced Research Projects Agency.
- Text
- Bellingham, Wash., USA : SPIE, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TA1660 .M565 1996g Off-site Start with a scan : a guide to transforming scanned photos and objects into high quality art / by Janet Ashford and John Odam.
- Text
- Berkeley, CA : Peachpit Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text T385 .A775 1996 Off-site Advances in laser scanning technology : August 27-28, 1981, San Diego, California / Leo Beiser, chairman/editor ; Cooperating Organizations, The Aerospace Corporation ... [et al.].
- Text
- Bellingham, Wash. : SPIE - the Society for Optical Engineering, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text TK7882.S3 A39 Off-site Miniaturized systems with micro-optics and micromechanics II : 10-12 February 1997, San Jose, California / M. Edward Motamedi, Larry J. Hornbeck, Kristofer S.J. Pister, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organization, DARPA--Defense Advanced Research Projects Agency.
- Text
- Bellingham, Wash., USA : SPIE, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TA1660 .M565 1997g Off-site Commercial adoption of advances in the analysis of scanner data / Randolph E. Bucklin, Sunil Gupta.
- Text
- Cambridge, Mass. : Marketing Science Institute, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text HF5415 .M31 no.98/100-103 Off-site Miniaturized systems with micro-optics and micromechanics III : 26-27 January 1998, San Jose, California / M. Edward Motamedi, Rolf Göring, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TA 1660 .M565 1998g Off-site Visual information retrieval / Alberto Del Bimbo.
- Text
- San Francisco, CA : Morgan Kaaufmann Publishers, 1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text TA1637 .D45 1999g Off-site Optical scanning : design and application : 21-22 July, 1999, Denver, Colorado / Leo Beiser, Stephen F. Sagan, Gerald F. Marshall, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Washington : SPIE, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7882.S3 O68 1999g Off-site Optical scanning for the business man / by Ralph Dyer [and others]
- Text
- New York : Hobbs, Dorman, [1966]
- 1966
- 1 Item
Item details Format Call Number Item Location Text HF5548.5.O6 .D98 Off-site Miniaturized systems with micro-optics and MEMS : 20-22 September 1999, Santa Clara, California / M.E. Motamedi, Rolf Goering, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SolidState Technology [and others].
- Text
- Bellingham, Wash., USA : SPIE, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TA1660 .M564 1999g Off-site MOEMS and miniaturized systems : 18-20 September 2000, Santa Clara, USA / M. Edward Motamedi, Rolf Göering, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] Sandia National Laboratories (USA).
- Text
- Bellingham, Wash., USA : SPIE, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M5326 2000g Off-site Principles of visual information retrieval / Michael S. Lew, ed.
- Text
- London ; New York : Springer, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TA1637 .P77 2001 Off-site MOEMS and miniaturized systems II : 22-24 October, 2001, San Francisco, [California] USA / M. Edward Motamedi, Rolf Göring, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International (USA) [and others].
- Text
- Bellingham, Washington : SPIE, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M5326 2001g Off-site Flexible decomposition of price promotion effects using store-level scanner data / Harald J. van Heerde, Peter S.H. Leeflang, and Dick R. Wittink.
- Text
- Cambridge, MA : Marketing Science Institute, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text HF5415 .M31 no.02/105-107 Off-site Optical scanning 2002 : 9 July 1999, Seattle, USA / Stephen F. Sagan, Gerald F. Marshall, Leo Beiser, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, The Boeing Company (USA) [and others].
- Text
- Bellingham, Wash., USA : SPIE, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TK7882.S3 O66 2002g Off-site MOEMS and miniaturized systems III : 27-29 January 2003, San Jose, California, USA / James H. Smith, Peter A. Krulevitch, Hubert K. Lakner, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, SolidState Technology, [and] Scandia National Laboratories (USA).
- Text
- Bellingham, Wash., USA : SPIE, [2003], ©2003.
- 2003-2003
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M5326 2003g Off-site A laser scanner for semiconductor devices / David E. Sawyer and David W. Berning : Electronic Technology Division.
- Text
- Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-24 Off-site Laser scanning of active semiconductor devices--videotape script / David E. Sawyer and David W. Berning ; Electronic Technology Division.
- Text
- Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt of Docs., U.S. Govt. Print. Off., 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-27 Off-site Laser scanning and recording : [proceedings] August 21-22, 1984, San Diego, California / Leo Beiser, chairman/editor ; cooperating organizations, Environmental Research Institute of Michigan ... [et al.].
- Text
- 1984
- 1 Item
Item details Format Call Number Item Location Text TK7882.S3 L35 1984 Off-site MOEMS and miniaturized systems IV : 27-28 January, 2004, San Jose, California, USA / Ayman El-Fatatry, chair/editor ; sponsored and puiblished by SPIE--the International Society for Optical Engineering.
- Text
- 2004
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M5326 2004g Off-site
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