Research Catalog

  • Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France / Bernard Courtois [and others], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, CNRS-INPG-UJF (France) in cooperation with IEEE Computer Society Test Technology Technical Committee.

    • Text
    • Bellingham, Wash., USA : SPIE, [1999], ©1999.
    • 1999-1999
    • 2 Items
    FormatCall NumberItem Location
    Text TK7874 .D4757 1999g v.1Off-site
    FormatCall NumberItem Location
    Text TK7874 .D4757 1999g v.2Off-site
  • Design, characterization, and packaging for MEMS and microelectronics : 27-29 October 1999, Royal Pines Resort, Queensland, Australia / Bernard Courtois, Serge Demidenko, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IREE Society (Australia), [and] Queensland Government State Development (Australia) ; cooperating organizations, LeGUMES--the Griffith University Microelectronics Engineering Society (Australia) [and others].

    • Text
    • Bellingham, Wash., USA : SPIE, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7875 .D48 1999gOff-site
  • Design, test, integration and packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France / Bernard Courtois [and others] chairs/editors ; sponsored by CNRS-INPG-UJF (France) [and others].

    • Text
    • Bellingham, Wash. : SPIE--the International Society for Optical Engineering, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text TK7875 .D47 2000gOff-site
  • Design, modeling, and simulation in microelectronics : 28-30 November 2000, Singapore / Bernard Courtois, Serge N. Demidenko, L.Y. Lau, chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) [and others].

    • Text
    • Bellingham, Wash., USA : SPIE, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .D4756 2000gOff-site
  • Design, test, integration and packaging of MEMS/MOEMS 2001 : 25-27 April, 2001, Cannes, France / Bernard Courtois [and others] chairs/editors ; sponsored by CNRS-INPG-UJF (France) [and others].

    • Text
    • Bellingham, Washington : SPIE, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TK7875 .D47 2001gOff-site
  • Design, test, integration and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, 2001, Cannes, France / Bernard Courtois [and others] chairs/editors ; sponsored by CNRS-INPG-UJF (France) [and others].

    • Text
    • Bellingham, Washington : SPIE, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TK7875 .D47 2002gOff-site
  • Memory technology, design and testing : proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France / editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.

    • Text
    • Los Alamitos, California : IEEE Computer Society, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TK7895.M4 I335 2002gOff-site

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