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Displaying 1-5 of 5 results for author "Hook, Terence."
1998 3rd International Symposium on Plasma Process-Induced Damage : June 4-5, 1998, Honolulu, Hawaii, USA / Moritaka Nakamura, Thuy Dao, and Terence Hook, editors ; technical co-sponsors, American Vacuum Society, IEEE/Electron Devices Society, Japanese Society of Applied Physics.
- Text
- Sunnyvale, California : Northern California Chapter of the American Vacuum Society, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .I5834 1998g Off-site 1999 4th International Symposium on Plasma Process-Induced Damage : May 9-11, 1999, Monterey, California, USA / Thuy Dao, Mitsumasa Koyanagi, and Terence Hook, editors ; technical co-sponsors, IEEE/Electron Devices Society, American Vacuum Society, Japanese Society of Applied Physics.
- Text
- Sunnyvale, CA : Northern California Chapter of the American Vacuum Society, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .I5834 1999g Off-site 2001 6th International Symposium on Plasma- and Process-Induced Damage : May 13-15, 2001, Monterey, California, USA / Manfred Englehardt, Terence Hook, and and Calvin T. Gabriel, editors ; technical co-sponsors, American Vacuum Society, IEEE/Electron devices Society, Japanese Society of Applied Physics.
- Text
- Santa Clara, California : Northern California Chapter of the American Vacuum Society, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .I5834 2001g Off-site 2002 7th International Symposium on Plasma- and Process-Induced Damage : June 5-7, 2002, Maui, Hawaii, USA / Terence Hook, Koji Eriguchi, and Calvin T. Gabriel, editors ; technical co-sponsors, AVS, IEEE/Electron Devices Society, Japanese Society of Applied Physics.
- Text
- Santa Clara, California : AVS, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .I5834 2002g Off-site 2002 8th International Symposium on Plasma- and Process-Induced Damage : April 24-25, 2003, Corbeil-Essonnes, France / Koji Eriguchi, S. Krishnan, and Terence Hook, editors ; [technical co-sponsors, IEEE/Electron Devices Society, Japanese Society of Applied Physics].
- Text
- 2003
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .I5834 2003g Off-site
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