Research Catalog

  • Semiconductor silicon 1986 : proceedings of the Fifth International Symposium on Silicon Materials Science and Technology / edited by Howard R. Huff, Takao Abe, Bernd Kolbesen ; Electronics and Dielectrics and Insulation Divisions [sponsors].

    • Text
    • Pennington, NJ : Electrochemical Society, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-737Offsite
  • Semiconductor silicon 1990 : papers presented at the sixth International Symposium on Silicon Materials Science and Technology, held 7-11, May, 1990 in Montreal / co-sponsored by the Electronics and Dielectrics and Insulation Divisions of the Electrochemical Society ; edited by Howard R. Huff, Keith G. Barraclough, Jun-ichi Chikawa.

    • Text
    • Pennington, N.J. : The Electrochemical Society, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 95-2015Offsite
  • Ultrathin SiO₂ and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A. / editors, H.R. Huff ... [et al.].

    • Text
    • Warrendale, PA : Materials Research Society, 1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 00-1551Offsite
  • Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology / [sponsored by Electronics Division of the Electrochemical Society, Inc.] ; editors, H.R. Huff, H. Tsuya, U. Gösele.

    • Text
    • Pennington, NJ : The Electrochemical Society, c1998.
    • 1998
    • 2 Items
    FormatCall NumberItem Location
    Text JSE 00-1163 v. 1Offsite
    FormatCall NumberItem Location
    Text JSE 00-1163 v. 2Offsite
  • High dielectric constant materials : VLSI MOSFET applications / H.R. Huff, D.C. Gilmer (eds.).

    • Text
    • Berlin ; New York : Springer, 2005.
    • 2005
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 06-1528Offsite
  • Semiconductor silicon 1994 : proceedings of the Seventh International Symposium on Silicon Materials Science and Technology / [sponsored by] Electronics division ; editors H.R. Huff, W. Bergholz, K. Sumino.

    • Text
    • Pennington, NJ : The Electrochemical society, [1994], ©1994.
    • 1994-1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .I58 1994gOff-site
  • Ultrathin SiO₂ and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A. / editors, H.R. Huff [and others].

    • Text
    • Warrendale, PA : Materials Research Society, 1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874.76 .U48 1999Off-site
  • Semiconductor silicon 1986 : proceedings of the Fifth International Symposium on Silicon Materials Science and Technology / edited by Howard R. Huff, Takao Abe, Bernd Kolbesen ; Electronics and Dielectrics and Insulation Divisions [sponsors].

    • Text
    • Pennington, NJ : Electrochemical Society, [1986], ©1986.
    • 1986-1986
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .I53 1986gOff-site
  • High dielectric constant materials : VLSI MOSFET applications / H.R. Huff, D.C. Gilmer (eds.).

    • Text
    • Berlin ; New York : Springer, 2005.
    • 2005
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .H52414 2005Off-site
  • Into the nano era : Moore's law beyond planar silicon CMOS / edited by Howard Huff.

    • Text
    • Berlin : Springer, [2009], ©2009.
    • 2009-2009
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .I5897 2009gOff-site
  • Semiconductor silicon 1981 : proceedings of the Fourth International Symposium on Silicon Materials Science and Technology / edited by Howard R. Huff, Rudolph J. Kriegler, Yoshiyuki Takeishi ; Electronics and Dielectrics and Insulation Divisions [sponsors].

    • Text
    • Pennington, NJ : Electrochemical Society, [1981], ©1981.
    • 1981-1981
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .I58 1981gOff-site
  • High dielectric constant materials : VLSI MOSFET applications / H.R. Huff, D.C. Gilmer (eds.).

    • Text
    • Berlin ; New York : Springer, 2005.
    • 2005
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .H533 2005Off-site
  • Semiconductor silicon 1977 : proceedings of the third International Symposium on Silicon Materials Science and Technology / edited by Howard R. Huff, Erhard Sirtl.

    • Text
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .I58 1977Off-site
  • Semiconductor silicon 1981 : proceedings of the Fourth International Symposium on Silicon Materials Science and Technology / edited by Howard R. Huff, Rudolph J. Kriegler, Yoshiyuki Takeishi ; Electronics and Dielectrics and Insulation Divisions [sponsors].

    • Text
    • Pennington, NJ : Electrochemical Society, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .I58 1981 GiftOff-site
  • High dielectric constant materials : VLSI MOSFET applications / H.R. Huff, D.C. Gilmer (eds.).

    • Text
    • Berlin ; New York : Springer, 2005.
    • 2005
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .H533 2005Off-site
  • Semiconductor silicon 1977 : proceedings of the third International Symposium on Silicon Materials Science and Technology / edited by Howard R. Huff, Erhard Sirtl.

    • Text
    • Princeton, N.J. : Electrochemical Society, ©1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .I58 1977Off-site
  • Semiconductor silicon 1981 : proceedings of the fourth International Symposium on Silicon Materials Science and Technology / edited by Howard R. Huff ... [et al. ; co-sponsored by the Electronics and the Dielectrics and Insulation Divisions of the Electrochemical Society].

    • Text
    • Pennington, N.J. : Electrochemical Society, ©1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .I58 1981Off-site

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