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Displaying 1-13 of 13 results for author "IEEE Computer Society. Test Technology Technical Committee. http://id.loc.gov/authorities/names/n88164000"
13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
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- Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7874.I3274 1995 Off-site IEEE standard terminology for semiconductor memory / sponsor, Test Technology Technical Committee of the IEEE Computer Society.
- Text
- New York, NY : Institute of Electrical and Electronics Engineers, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I433 1992 Off-site Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 1995, San Jose, Calfornia / edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI in cooperation with the IEEE Solid State Circuits Council.
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- Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I334 1995 Off-site Proceedings of the Fourth Asian Test Symposium, November 23-24, 1995, Bangalore, India / sponsored by the IEEE Computer Society's Technical Committee on Test Technology and the VLSI Society of India (VSI).
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 1995 Off-site Sixth IEEE International Workshop on Rapid System Prototyping : June 7-9, 1995, Chapel Hill, North Carolina : proceedings : shortening the path from specification to prototype / proceedings editor, Rudy Lauwereins ; sponsored by the IEEE Computer Society Technical Committee on Design Automation, the IEEE Computer Society Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I573 1995 Off-site Records of the 1996 IEEE International Workshop on Memory Technology, Design and Testing, August 13-14, 1996, Singapore / edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I334 1996 Off-site 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
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- Los Alamitos, Calif. : IEEE Computer Society Press, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TK7874.I3274 1996 Off-site Proceedings, International Test Conference, 1991.
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- Altoona, PA : International Test Conference ; Piscataway, NJ : additional copies can be ordered from IEEE Service Center, c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I593 1991 Off-site Proceedings, International Test Conference, 1992.
- Text
- 1992
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I593 1992 Off-site 12th IEEE VLSI Test Symposium : April 25-28, 1994, Cherry Hill, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
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- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7874.I3274 1994 Off-site Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI.
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- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I334 1994 Off-site Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan / sponsored by IEEE Computer Society Test Technology Technical Committee in cooperation with Technical Group on Fault Tolerant Systems (IEICE) ... [et al.].
- Text
- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 1994 Off-site IEEE standard test access port and boundary-scan architecture / Sponser, Test Technology Technical Committee of the IEEE Computer Society.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I435 1993 Off-site
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