Research Catalog

New! Try our Article Search to discover online journals, books, and more from home with your library card.

Selected filters.Clear Filters

  • The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling [microform] / Marek-Jerzy Pindera, Jacob Aboudi, Steven M. Arnold.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information ; Springfield, VA : National Technical Information Service [distributor, 1999]
    • 1999

  • Analysis of space environment damage to solar cell assemblies from LDEF experiment A0171-GSFC test plate [microform] : final report, 21 Jul. 1993 - 19 Aug. 1994 / by David C. Hill & M. Frank Rose.

    • Text
    • Auburn University, AL : Space Power Institute ; Huntsville, AL : NASA George C. Marshall Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994

  • P-polarized reflectance spectroscopy [microform] : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions / Nikolaus Dietz and Klaus J. Bachmann.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]
    • 1995

  • On the numerical solution of the dynamically loaded hydrodynamic lubrication of the point contact problem [microform] / Sang G. Lim, David E. Brewe and Joseph M. Prahl.

    • Text
    • [Washington, D.C.?] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, [1990]
    • 1990

  • Ellipsometric study of YBa₂Cu₃O₇₋x laser ablated and co-evaporated films [microform] / S.A. Alterovitz ... [et al.] ; prepared for the International Conference on Electronic Materials 1990, sponsored by the Materials Research Society, Newark, New Jersey, September 17-19, 1990.

    • Text
    • [Washington, D.C.] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1990?]
    • 1990

  • System for the growth of bulk SiC crystals by modified CVD techniques [microform] : final report / Andrew J. Steckl, principal investigator.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994

  • Enhancement of thickness uniformity of thin films grown by pulsed laser deposition [microform] / Félix E. Fernández.

    • Text
    • [Washington, D.C.? : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]
    • 1995-1995

  • Non-coalescence effects in microgravity [microform] : (NAG 3-1894), performance report for the period 17 June 1996 - 16 June 1997 / by G. Paul Neitzel, principal investigator.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
    • 1997

  • Experimental study of load carrying capacity of point contacts at zero entrainment velocity [microform] / B.A. Shogrin ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; Springfield, VA : National Technical Information Service, distributor, [1998]
    • 1998

  • Experimental determination of load carrying capacity of point contacts at zero entrainment velocity [microform] / Bradley A. Shogrin ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999

  • Evaluation of a procedure for the measurement of thin film thickness by X-ray reflectivity [microform] / Jeannette Benavides.

    • Text
    • Greenbelt, Md. : National Aeronautics and Space Administration, Goddard Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor], 1997.
    • 1997

  • The effect of sliding speed on film thickness and pressure supporting ability of a point contact under zero entrainment velocity conditions [microform] / Peter M. Thompson ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; Springfield, VA : National Technical Information Service, distributor, [2000]
    • 2000

  • Dynamic response of film thickness in spiral-groove face seals [microform] / Eliseo DiRusso.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by the National Technical Information Service, 1985.
    • 1985
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS54398

  • Characteristic morphological and frictional changes in sputtered MoS₂ films [microform] / Talivaldis Spalvins.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration, 1984]
    • 1984

  • Enhancement of aviation fuel thermal stability characterization through application of ellipsometry / Samuel Tucker Browne ... [and others].

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, [2012]
    • 2011
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo26312

  • Ice-accretion scaling using water-film thickness parameters / David N. Anderson, Alejandro Feo.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center, [2003]
    • 2003
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo33286

  • Ice-accretion scaling using water-film thickness parameters [microform] / David N. Anderson, Alejandro Feo.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center, [2003]
    • 2003

  • Correlation of asperity contact-time fraction with elastohydrodynamic film thickness in a 20-millimeter-bore ball bearing / John J. Coy.

    • Text
    • Washington, D.C. : National Aeronautics and Space Administration, Scientific and Technical Information Branch, October 1979.
    • 1979-10
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo52214

  • On the correlation of specific film thickness and gear pitting life / Timothy L. Krantz.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, April 2015.
    • 2015-4
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo59874

  • The effect of sliding speed on film thickness and pressure supporting ability of a point contact under zero entrainment velocity conditions / Peter M. Thompson [and three others].

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 2000.
    • 2000-12
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo86211

No results found from Digital Research Books Beta

Digital books for research from multiple sources world wide- all free to read, download, and keep. No Library Card is Required. Read more about the project.

digital-research-book
Explore Digital Research Books Beta