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  • Software assessment : reliability, safety, testability / Michael A. Friedman, Jeffrey M. Voas.

    • Text
    • New York : Wiley, ©1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.Q35 F75 1995Off-site

  • The political reliability of the Warsaw Pact armies : the southern tier / Iván Völgyes.

    • Text
    • Durham, N.C. : Duke University Press, 1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text UA646.8 .V64 1982Off-site

  • Practical reliability engineering / Patrick D.T. O'Connor.

    • Text
    • London ; Philadelphia : Heyden, ©1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text TS173 .O29 1981Off-site

  • Reliability: management, methods, and mathematics [by] David K. Lloyd and Myron Lipow.

    • Text
    • Englewood Cliffs, N.J., Prentice-Hall, 1962.
    • 1962
    • 1 Item
    FormatCall NumberItem Location
    Text 9250.592Off-site

  • Computing systems reliability / edited by T. Anderson and B. Randell.

    • Text
    • Cambridge ; New York : Cambridge University Press, 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.5.C618Off-site

  • Mathematical models for the study of the reliability of systems / A. Kaufmann, D. Grouchko, R. Cruon ; translated by Technical Translations.

    • Text
    • New York : Academic Press, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text TS173.K3813Off-site

  • Systems reliability and risk analysis / by Ernst G. Frankel.

    • Text
    • The Hague ; Boston : M. Nijhoff ; Hingham, MA : Distributors for the U.S. and Canada, Kluwer Boston, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text TA169 .F73 1984Off-site

  • Practical reliability engineering / Patrick D.T. O'Connor.

    • Text
    • Chichester ; New York : Wiley, ©1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text TS173 .O29 1985Off-site

  • A new method for estimating contraceptive failure rates / John Bongaarts, Germán Rodriguez.

    • Text
    • New York, N.Y. : Population Council, 1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text PSC Pop. CouncilOff-site

  • Stochastic models in reliability theory : proceedings of a symposium, held in Nagoya, Japan, April 23-24, 1984 / edited by S. Osaki and Y. Hatoyama.

    • Text
    • Berlin ; New York : Springer-Verlag, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text TA169 .S76 1984Off-site

  • The theory and practice of reliable system design / Daniel P. Siewiorek, Robert S. Swarz.

    • Text
    • Bedford, MA : Digital Press, ©1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.5 .S538 1982Off-site

  • Using published data : errors and remedies / Herbert Jacob.

    • Text
    • Beverly Hills : Sage Publications, ©1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text HA29 .J23 1984Off-site

  • Software reliability / H. Kopetz.

    • Text
    • London : Macmillan, 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.6 .K6513Off-site

  • Advances in structural reliability : proceedings of the Advanced Seminar on "Structural Reliability," held at the Joint Research Centre, Ispra, Italy, 4-8 June 1984 / edited by Alfredo C. Lucia.

    • Text
    • Dordrecht ; Boston : D. Reidel Pub. Co., ©1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text TA656 .A38 1984Off-site

  • Survey research designs : towards a better understanding of their costs and benefits / prepared under the auspices of the Working Group on the Comparative Evaluation of Longitudinal Surveys, Social Science Research Council ; edited by R.W. Pearson and R.F. Boruch.

    • Text
    • Berlin ; New York : Springer-Verlag, ©1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text HN29 .S879Off-site

  • Reliability considerations in fiber optic applications : [papers] : 25-26 September 1986, Cambridge, Massachusetts / Dilip K. Paul, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics, University of Alabama in Huntsville [and others].

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text TA1800 .R45 1987Off-site

  • Software reliability modelling and identification / Sergio Bittanti (ed.).

    • Text
    • Berlin ; New York : Springer-Verlag, ©1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.R44 S66 1988Off-site

  • Solder joint technology : materials, properties, and reliability / King-Ning Tu.

    • Text
    • New York : Springer, ©2007.
    • 2007
    • 1 Item
    FormatCall NumberItem Location
    Text TA492.W4 T844 2007Off-site

  • Handbook of power quality / edited by Angelo Baggini.

    • Text
    • Chichester, England ; Hoboken, NJ : John Wiley & Sons, ©2008.
    • 2008
    • 1 Item
    FormatCall NumberItem Location
    Text TK3001 .H34 2008Off-site

  • Micro and nano mechanical testing of materials and devices / Fuqian Yang, James C.M. Li, editors.

    • Text
    • New York : Springer, ©2008.
    • 2008
    • 1 Item
    FormatCall NumberItem Location
    Text TK7875 .M53 2008Off-site

  • Reliability and risk issues in large scale safety-critical digital control systems / Poong Hyun Seong, editor ; with additional contributions by Poong Hyun Seong [and others].

    • Text
    • London : Springer, ©2009.
    • 2009
    • 1 Item
    FormatCall NumberItem Location
    Text TJ223.M53 R45 2009Off-site

  • Systems reliability and risk analysis / by Ernst G. Frankel.

    • Text
    • Dordrecht ; Boston : Kluwer Academic Publishers, ©1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text TA169 .F73 1988Off-site

  • Reliability studies of finite element methods in North America / by Jerzy J. Kacprzynski ; North Atlantic Treaty Organization, Advisory Group for Aerospace Research and Development.

    • Text
    • Neuilly-sur-Seine, France : AGARD, 1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text AGARD-R-748Off-site

  • Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.

    • Text
    • Boston : Kluwer Academic Publishers, ©1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.99.M44 J49 1990Off-site

  • Reliability engineering : basic concepts and applications in ICT / Massimo Lazzaroni [and others].

    • Text
    • Berlin : Springer, ©2011.
    • 2011
    • 1 Item
    FormatCall NumberItem Location
    Text TA169 .R4393 2011Off-site

  • Industrial applications of evolutionary algorithms / Ernesto Sanchez, Giovanni Squillero, and Alberto Tonda.

    • Text
    • Heidelberg ; New York : Springer, ©2012.
    • 2012
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.618 .S26 2012Off-site

  • Error-free software : know-how and know-why of program correctness / Robert Laurence Baber ; translated from the German original by the author.

    • Text
    • Chichester, England ; New York : Wiley, ©1991.
    • 1991
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.R44 B33 1991Off-site

  • Reliability of gallium arsenide MMICs / edited by Aris Christou.

    • Text
    • Chichester ; New York : Wiley, ©1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7876 .R445 1992Off-site

  • Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A. / editors, Peter Børgesen [and others].

    • Text
    • Pittsburgh, Pa. : Materials Research Society, ©1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3444 1994Off-site

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