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  • ARPA/NBS workshop III : test patterns for integrated circuits / Harry A. Schafft, editor ; Electronic Technology Division.

    • Text
    • Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-15Off-site

  • The destructive bond pull test / John Albers, editor ; Electronic Technology Division.

    • Text
    • [Washington] : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-18Off-site

  • Planar test structures for characterizing impurities in silicon / M. G. Buehler [and others] ; Electronic Technology Division.

    • Text
    • Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-21Off-site

  • Microelectronic test pattern NBS-3 for evaluating the resistivity-dopaut density relationship of silicon / Martin G. Buehler ; Electronic Technology Division.

    • Text
    • Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-22Off-site

  • ARPA/NBS workshop IV : surface analysis for silicon devices / A. George Lieberman, editor ; Electronic Technology Division.

    • Text
    • Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-23Off-site

  • Defects in PN junctions and MOS capacitors observed using thermally simulated current and capacitance measurements--video script / Martin G. Buehler ; Electronic Technology Division.

    • Text
    • Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt of Docs., U.S. Govt. Print. Off., 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-26Off-site

  • Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes / James M. Kenney ; Electronic Technology Division.

    • Text
    • Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-7Off-site

  • NBS/FDA Workshop, Reliability Technology for Cardiac Pacemakers / Harry A. Schafft, editor ; Electronic Technology Division.

    • Text
    • Washington : U.S. Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-28Off-site

  • A laser scanner for semiconductor devices / David E. Sawyer and David W. Berning : Electronic Technology Division.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-24Off-site

  • The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon / Sheng S. Li : Electronic Technology Division.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division: for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-33Off-site

  • Semiconductor measurement technology : notes on SEM examination of microelectronic devices / John R. Devaney, K. O. Leedy and W. J. Keery.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-35Off-site

  • Semiconductor measurement technology : reliability technology for cardiac pacemakers II, a workshop report / Harry A Schafft, editor ; Electronic Technology Division.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-42Off-site

  • Safe operating area limits for power transistors / David L. Blackburn : Electionic Technology Division.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-44Off-site

  • Microelectronic test pattern NBS-4 / W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-32Off-site

  • Automated photomask inspection / Donald B. Novotny and Dino R. Ciarlo.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-46Off-site

  • Laser scanning of active semiconductor devices--videotape script / David E. Sawyer and David W. Berning ; Electronic Technology Division.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt of Docs., U.S. Govt. Print. Off., 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-27Off-site

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