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Electron microprobe analysis / S. J. B. Reed.
- Text
- Cambridge [Eng] ; New York : Cambridge University Press, 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSD 75-1063 Offsite Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Text
- New York : Wiley, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSF 75-1300 Offsite Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart.
- Text
- New York : Plenum Press, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSE 77-34 Offsite Advanced techniques in failure analysis.
- Text
- New York.
- unknown-present
- 4 Items
Item details Format Call Number Item Location Text JSP 79-188 1977 Offsite Item details Format Call Number Item Location Text JSP 79-188 1978 Offsite Item details Format Call Number Item Location PRINT JSP 79-188 Schwarzman Building - Main Reading Room 315 Not available - Please for assistance.Untersuchung bestrahlter Materialen mit der Mikrosonde erläutert an UO₄-Mo- und UO₄-Zirkaloy-Spaltstoffcermets / von G. Giacchetti und J. Ränsch.
- Text
- [Luxembourg]: Europäisches Institut für Transurane, 1970.
- 1970
- 1 Item
Item details Format Call Number Item Location Text JSF 79-613 Offsite Electron microscopy and analysis, 1981 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Cambridge, 7-10 September 1981 (EMAG 81) / edited by M.J. Goringe.
- Text
- Bristol : Institute of Physics, 1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text JSK 77-69 no. 61 v. 61 (1981) Offsite Microprobe analysis in biology and medicine / edited by Patrick Echlin, Raimund Kaufmann.
- Text
- Stuttgart : S. Hirzel, 1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSE 82-933 Offsite Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
- Text
- New York : Marcel Dekker, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text JSF 83-370 Offsite Beiträge zur 6. Tagung Mikrosonde, 18.-20. Januar 1984 in Dresden / herausgegeben von A. Röder, S. Däbritz und L. Küchler.
- Text
- [Berlin] : Physikalische Gesellschaft der DDR, [1984?]
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSD 86-239 Offsite Electron microprobe analysis / S.J.B. Reed.
- Text
- Cambridge [England] ; New York, NY, USA : Cambridge University Press, 1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSE 94-1144 Offsite Microprobe techniques in the earth sciences / edited by Philip J. Potts ... [et al.].
- Text
- London ; New York : Chapman & Hall, 1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text JSE 95-1725 Offsite Fabrication of silicon microprobes for optical near-field applications / Phan Ngoc Minh, Ono Takahito, Esashi Masayoshi.
- Text
- Boca Raton, Fla. : CRC Press, c2002.
- 2002
- 1 Item
Item details Format Call Number Item Location Text JSE 02-1165 Offsite Journal of trace and microprobe techniques [electronic resource].
- Text
- New York, NY : Marcel Dekker, -©2003.
- 1982-2003
- 2 Resources
Available Online
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The Stanford-U.S. Geological Survey SHRIMP ion microprobe : a tool for micro-scale chemical and isotopic analysis / [Charles R. Bacon [and three others]].
- Text
- [Reston, Va.] : U.S. Department of the Interior, U.S. Geological Survey, 2012.
- 2012
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo36585Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
- Text
- New York : M. Dekker, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 M87 1991 Off-site Electron microprobe analysis / S.J.B. Reed.
- Text
- Cambridge [England] ; New York, NY, USA : Cambridge University Press, 1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text QD117.E42 R43 1993 Off-site Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 / edited by K. F. J. Heinrich and D. E. Newbury.
- Text
- Washington : U.S. Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text QD96.M3 W67 1974 Off-site Electron microscopy and analysis, 1981 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Cambridge, 7-10 September 1981 (EMAG 81) / edited by M.J. Goringe.
- Text
- Bristol : Institute of Physics, 1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 E5 1981 Off-site Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
- Text
- New York : Marcel Dekker, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 M87 1982 Off-site Applications of nuclear microprobes in the life sciences : an efficient analytical technique for research in biology and medicine / Yvan Llabador & Philippe Moretto.
- Text
- Singapore ; River Edge, NJ : World Scientific, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text QH324.9.M5 L53 1998 Off-site Electron microprobe analysis / S. J. B. Reed.
- Text
- Cambridge [Eng] ; New York : Cambridge University Press, 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text QD117.E42 R43 Off-site Microprobe characterization of optoelectronic materials / edited by Juan Jiménez.
- Text
- New York : Taylor & Francis, 2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text QC611.6.O6 M52 2003 Off-site The proton microprobe : applications in the biomedical field / author, Ronald D. Vis.
- Text
- Boca Raton, Fla. : CRC Press, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text QH324.9.M5 V57 1986 Off-site Microprobe analysis in medicine / edited by Peter Ingram, John D. Shelburne, Victor L. Roggli.
- Text
- New York : Hemisphere, [1989], ©1989.
- 1989-1989
- 1 Item
Item details Format Call Number Item Location Text RB43.6 .M53 1989 Off-site Microprobe analysis as applied to cells and tissues : proceedings of a conference at Battelle Seattle Research Center, Seattle, Washington, U.S.A., April 30-May 2, 1973 / edited by Theodore Hall, Patrick Echlin, Raimund Kaufmann.
- Text
- London ; New York : Academic Press, 1974.
- 1974
- 1 Item
Item details Format Call Number Item Location Text QH324.9.M5 M58 1974 Off-site Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Text
- New York : Wiley, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 Si1 1975 Off-site Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart.
- Text
- New York : Plenum Press, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 G57 1975 Off-site The Cosslett Festschrift.
- Text
- Oxford [England] : Published for the Royal Microscopical Society by Blackwell Scientific Publications, 1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 C6 Off-site An introduction to X-ray spectrometry : X-ray fluorescence and electron microprobe analysis / K.L. Williams.
- Text
- London ; Boston : Allen & Unwin, 1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text QE435 .W55 1987 Off-site The system CO₂-CH₄-N₂ in fluid inclusions : theoretical modelling and geological applications / door Alfonsus Martinus van den Kerkhof.
- Text
- Amsterdam : Free University Press, 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text QE364.2.F47 K47 1988g Off-site Electron microprobe analysis and scanning electron microscopy in geology / S.J.B. Reed.
- Text
- Cambridge, [England] ; New York, NY : Cambridge University Press, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text QE440 .R43 1996 Off-site Microprobe analysis, edited by C. A. Andersen.
- Text
- New York, Wiley [1973]
- 1973
- 1 Item
Item details Format Call Number Item Location Text QD98.A48 Off-site Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Text
- New York : Wiley, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.E4S53 1975 Off-site Electron microprobe analysis / S. J. B. Reed.
- Text
- Cambridge [Eng] ; New York : Cambridge University Press, 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text QD117.E42R43 Off-site Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart.
- Text
- New York : Plenum Press, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.S3G64 Off-site Electron microscopy and analysis, 1983 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Guildford, 30 August - 2 September 1983 (EMAG 83) / edited by P. Doig.
- Text
- Bristol : Institute of Physics, c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 I56 1983 Off-site Electron microscopy and analysis, 1985 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Newcastle upon Tyne, 2-5 September 1985 (EMAG 85) / edited by GJ Tatlock.
- Text
- Bristol, [Avon] ; Boston : A. Hilger, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 I56 1985 Off-site Electron microprobe analysis / S.J.B. Reed.
- Text
- 1993
- 1 Item
Item details Format Call Number Item Location Text QD117.E42R43 1993 Off-site Microprobe analysis, edited by C.A. Andersen.
- Text
- New York, Wiley [1973]
- 1973
- 1 Item
Item details Format Call Number Item Location Text QD98.A48 Off-site Electron microprobe analysis / S.J.B. Reed.
- Text
- Cambridge [Eng] ; New York : Cambridge University Press, 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text QD117.E42R43 Off-site Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; foreword by T.E. Everhart.
- Text
- New York : Plenum Press, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.S3G64 Off-site Electron microscopy and analysis, 1983 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Guildford, 30 August - 2 September 1983 (EMAG 83) / edited by P. Doig.
- Text
- Bristol : Institute of Physics, c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 I56 1983 Off-site The Science of biological specimen preparation for microscopy and microanalysis, 1985 : proceedings of the 4th Pfefferkorn Conference, held March 25-30, 1985 at the Grand Canyon Squire Inn, Grand Canyon, AZ / edited by Martin Müller [and others] ; managing editor, Sudha A. Bhatt.
- Text
- AMF O'Hare [Chicago], IL., U.S.A. : Scanning Electron Microscopy, ©1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text QH207 .P44 1985 Off-site Electron microprobe analysis / S.J.B. Reed.
- Text
- Cambridge [England] ; New York, NY, USA : Cambridge University Press, 1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text QD117.E42 R43 1993 Off-site
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