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Displaying 1-37 of 37 results
X-ray microanalysis in the electron microscope / John A. Chandler.
- Text
- Amsterdam ; New York : North-Holland Pub. Co., 1978, c1977.
- 1978-1977
- 1 Item
Item details Format Call Number Item Location Text JSD 79-908 Offsite X-ray microscopy : proceedings of the international symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983 / editors, G. Schmahl and D. Rudolph.
- Text
- Berlin ; New York : Springer-Verlag, 1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSE 85-942 Offsite Examining the submicron world / edited by Ralph Feder, J. Wm. McGowan and Douglas M. Shinozaki.
- Text
- New York : Plenum Press : Published in cooperation with NATO Scientific Affairs Division, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSF 86-1063 Offsite Modern microscopies : techniques and applications / edited by P.J. Duke and A.G. Michette.
- Text
- New York : Plenum Press, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text JSE 91-1116 Offsite X-ray optics and microanalysis 1992 : proceedings of the Thirteenth International Congress, UMIST, Manchester, UK, 31 August-4 September 1992 / edited by P.B. Kenway ... [et al.].
- Text
- Bristol [England] ; Philadelphia : Institute of Physics, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSE 93-777 Offsite X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 / D. Sayre ... [et al.].
- Text
- Berlin ; New York : Springer-Verlag, 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSE 88-3635 Offsite X-ray microscopy, by V.E. Cosslett and W.C. Nixon.
- Text
- Cambridge, [Eng.] University Press, 1960.
- 1960
- 1 Item
Item details Format Call Number Item Location Text OCC (Cosslett, V. E. X-ray microscopy) Offsite X-ray microscopy and microradiography; proceedings of a symposium held at the Cavendish Laboratory, Cambridge. 1956. Edited by V. E. Cosslett, Arne Engström [and] H. H. Pattee, Jr.
- Text
- New York, Academic Press, 1957.
- 1957
- 1 Item
Item details Format Call Number Item Location Text PEW (Symposium on X-Ray Microscopy and Microradiography. 1st, Cambridge, Eng., 1956. X-ray microscopy and microradiography) Offsite Microprojection with x-rays / by Ong Sing Poen.
- Text
- The Hague : Martinus Nijhoff, 1959.
- 1959
- 1 Item
Item details Format Call Number Item Location Text PEW (Wang. Microprojection with E-xrays) Offsite Advanced water window x-ray microscope design and analysis [microform] : final report, 1992 / D.L. Shealy ... [et al.].
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1992]
- 1992
X-ray microscope assembly and alignment support and advanced X-ray microscope design and analysis [microform] : final report / principal investigator: David L. Shealy.
- Text
- Birmingham, AL : University of Alabama at Birmingham, Dept. of Physics ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1991]
- 1991
X-ray microscope/telescope test and alignment [microform] : final report / prepared by Center for Applied Optics, University of Alabama in Huntsville.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1991]
- 1991
Ultra-high resolution water window x-ray microsope optical design and analysis, purchase order no. H-13006D, final report, 1993 [microform] / D.L. Shealy and C. Wang.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1992]
- 1993
Ultra-high resolution water window x-ray microscope optical design and analysis, purchase order no. H-13006D [microform] : final report, 1993 / D.L. Shealy and C. Wang.
- Text
- [Washington, DC : National Aeronautics and Space Administration, 1993]
- 1993
Design and analysis of a fast, two-mirror soft-x-ray microscope [microform] / D.L. Shealy ... [et al.].
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1993]
- 1992
Interferometric and optical tests of water window imaging X-ray microscopes [microform] : final report / prepared by Center for Applied Optics, University of Alabama in Huntsville, Huntsville, Alabama.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1993]
- 1993
Advanced tomographic imaging methods for the analysis of materials : symposium held November 28-30, 1990, Boston, Massachusetts, U.S.A. / editors, Jerome L. Ackerman, William A. Ellingson.
- Text
- Pittsburgh, Pa. : Materials Research Society, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TA417.2 .A38 1991 Off-site X-ray microscopy III : proceedings of the third international conference, London, September 3-7, 1990 / A.G. Michette, G.R. Morrison, C.J. Buckley (eds.).
- Text
- Berlin ; New York : Springer-Verlag, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text QH212.X2 X24 1992 Off-site X-ray optics and microanalysis 1992 : proceedings of the thirteenth international congress, University of Manchester, UMIST, UK, 31 August-September 1992 / edited by P.B. Kenway [and others].
- Text
- Bristol [England] ; Philadelphia : Institute of Physics Pub., [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TA417.23 .X17 1993 Off-site X-ray microbeam technology and applications : 11-12 July, 1995, San Diego, California / Wenbing Yun, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text QC482 .X75 1995g Off-site X-ray microfocusing : applications and techniques : 22-23 July 1998, San Diego, California / Ian McNulty, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TA1775 .X196 1998 Off-site X-ray microscopy : proceedings of the international symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983 / editors, G. Schmahl and D. Rudolph.
- Text
- Berlin ; New York : Springer-Verlag, 1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text QH212.X2 X2 1984 Off-site X-ray microscopy / by V.E. Cosslett and W.C. Nixon.
- Text
- Cambridge, [Eng.] : University Press, 1960.
- 1960
- 1 Item
Item details Format Call Number Item Location Text QC373.X2 C82 1960 Off-site Examining the submicron world / edited by Ralph Feder, J. Wm. McGowan and Douglas M. Shinozaki.
- Text
- New York : Plenum Press, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 N37 1984 Off-site X-ray microscopy : instrumentation and biological applications / Edited by Ping-chin Cheng and Gwo-jen Jan.
- Text
- Berlin ; New York : Springer-Verlag, [1987], ©1987.
- 1987-1987
- 1 Item
Item details Format Call Number Item Location Text QH212.X2 X23 1987 Off-site X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 / D. Sayre [and others].
- Text
- Berlin ; New York : Springer-Verlag, 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text QH212.X2 X23 1988 Off-site X-ray/EUV optics for astronomy and microscopy : 7-11 August, 1989, San Diego, California / Richard B. Hoover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University [and others].
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1989], ©1989.
- 1989-1989
- 1 Item
Item details Format Call Number Item Location Text QB472.A1 X232 1989g Off-site X-ray instrumentation in medicine and biology, plasma physics, astrophysics, and synchrotron radiation : 25-28 April 1989, Paris, France / Rene Benattar, chair/editor ; ECO2, The Congress of EPS--European Physical Society, Europtica--The European Federation for Applied Optics, SPIE--The International Society for Optical Engineering ; cooperating organizations, ANRT--Association nationale de la recherche technique [and others].
- Text
- Bellingham, Wash., USA : SPIE--The International Society for Optical Engineering, [1989], ©1989.
- 1989-1989
- 1 Item
Item details Format Call Number Item Location Text TA1775 .X72 1989g Off-site Modern microscopies : techniques and applications / edited by P.J. Duke and A.G. Michette.
- Text
- New York : Plenum Press, [1990], ©1990.
- 1990-1990
- 1 Item
Item details Format Call Number Item Location Text QH207 .M63 1990 Off-site X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography : proceedings : 9-13 July 1990, San Diego, California / Richard B. Hoover, Arthur B.C. Walker, Jr., chairs/editors : sponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text QB472 .X73 1991g Off-site X-ray microscopy / by V.E. Cosslett and W.C. Nixon.
- Text
- Cambridge [Eng.] : University Press, 1960.
- 1960
- 1 Item
Item details Format Call Number Item Location Text 8294.269 Off-site X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 / D. Sayre ... [et al.].
- Text
- Berlin ; New York : Springer-Verlag, 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text QH212.X2 X23 1988 Off-site X-ray/EUV optics for astronomy and microscopy : 7-11 August, 1989, San Diego, California / Richard B. Hoover, chair/editor ; sponsored by SPIE--The International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text QB472 .X72 Off-site Instrumententwicklung in der Nanotechnologie am Beispiel des transmittierenden Röntgenmikroskops der Universitätssternwarte Göttingen / Andreas Junk.
- Text
- 2013
- 1 Item
Item details Format Call Number Item Location Text QH212 .X2J86 2013 Off-site Ultrasoft x-ray microscopy : its application to biological and physical sciences / edited by Donald F. Parsons.
- Text
- 1980
- 1 Item
Available Online
http://dx.doi.org/10.1111/nyas.1980.342.issue-1Item details Format Call Number Item Location Text 8001.604.2 vol.342 Off-site X-ray microscopy, by V.E. Cosslett and W.C. Nixon.
- Text
- Cambridge, University Press, 1960.
- 1960
- 1 Item
Item details Format Call Number Item Location Text 8294.269 Off-site Ultrasoft x-ray microscopy : its application to biological and physical sciences / edited by Donald F. Parsons.
- Text
- New York, N.Y. : New York Academy of Sciences, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text 8001.604.2 vol.342 Off-site
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