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  • 17th IEEE VLSI Test Symposium : proceedings : April 25-29, 1999, Dana Point, California / sponsored by IEEE Computer Society Test Technology Technical Council.

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I326 1999gOff-site

  • 18th IEEE VLSI Test Symposium : proceedings : April 30-May 4, 2000, Montreal, Quebec, Canada / sponsored by IEEE Computer Society Test Technology Technical Council.

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I326 2000gOff-site

  • Proceedings : 6th IEEE International On-Line Testing Workshop : July 3-5, 2000, Palma De Mallorca, Spain / sponsored by IEEE Computer Society Test Technology Technical Council in cooperation with University of Illes Balears.

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text TK7867 .I377 2000gOff-site

  • Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California / edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text TK7895.M4 I335 2000gOff-site

  • IEEE International High-Level Design Validation and Test Workshop : 8-10 November 2000, Berkeley, California : proceedings / sponsored by IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on Design Automation.

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.V47 I34 2000gOff-site

  • Proceedings : seventh international on-line testing workshop : 9-11 July, 2001, Giardini Naxos, Taormina, Italy / sponsored by IEEE Computer Society Test Technology Technical Council.

    • Text
    • Los Alamitos, California : IEEE Computer Society, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TK7867 .I377 2001gOff-site

  • Proceedings : 2001 IEEE International Workshop on Memory Technology, Design and Testing : August 6-7, 2001, San Jose, California, USA / editors, Yervant Zorian [and others] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.

    • Text
    • Los Alamitos, California : IEEE Computer Society, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TK7895.M4 I335 2001gOff-site

  • Sixth IEEE International High-Level Design Validation and Test Workshop : proceedings : 7-9 November, 2001 / sponsored by IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on Design Automation.

    • Text
    • Los Alamitos, California : IEEE Computer Society, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.V47 I34 2001gOff-site

  • Proceedings, the first IEEE International Workshop on Electronic Design, Test and Applications : [DELTA]'2002, 29-31 January 2002, Christchurch, New Zealand / edited by M. Renovell [and others] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), Massey University, New Zealand ; in cooperation with MOSIS [and others] ; with assistance from IEE--Institution on Electrical Engineers, IPENZ--Institute of Professional Engineers of New Zealand.

    • Text
    • Los Alamitos, California : IEEE Computer Society, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TK7855 .I44 2002gOff-site

  • On-Line Testing Workshop : proceedings of the Eighth International On-Line Testing Workshop : (IOLTW 2002) : 8-10 July, 2002, Hotel Delos--Isle of Bendor, France / [sponored by IEEE Computer Society Test Technology Technical Council].

    • Text
    • Los Alamitos, California : IEEE Computer Society, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TK7867 .I377 2002gOff-site

  • Memory technology, design and testing : proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France / editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.

    • Text
    • Los Alamitos, California : IEEE Computer Society, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TK7895.M4 I335 2002gOff-site

  • Seventh IEEE International High-Level Design Validation and Test Workshop : 27-29 October 2002, Cannes, France : proceedings / sponsored by IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on Design Automation.

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.V47 I34 2002gOff-site

  • Proceedings : ninth IEEE International On-Line Testing Symposium : proceedings : 7-9 July, 2003, Kos International Convention Center, Kos Island, Greece / edited by, C. Metra ... [et al.] ; sponored by IEEE Computer Society Test Technology Technical Council.

    • Text
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text TK7867 .I125 2003gOff-site

  • Memory technology, design and testing : records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing : 28-29 July, 2003, San Jose, California / sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid-State Circuits Society.

    • Text
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text TK7895.M4 I335 2003gOff-site

  • Proceedings : 4th International Workshop on Microprocessor Test and Verification, common challenges and solutions, MTV 2003, Hyatt Town Lake Hotel, Austin, Texas, May 29-30, 2003 / [edited by Magdy S. Abadir and Li-C. Wang] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC).

    • Text
    • 2003
    • 1 Item

    Available Online

    http://ieeexplore.ieee.org/servlet/opac?punumber=8841
    FormatCall NumberItem Location
    Text TK7895.M5 I585 2003gOff-site

  • Eighth IEEE International High-Level Design Validation and Test Workshop : proceedings : 12-14 November, 2003, San Francisco, California / sponsored by IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on Design Automation.

    • Text
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.V47 I34 2003gOff-site

  • IEEE design & test of computers / IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc.

    • Text
    • Los Alamitos, CA : IEEE Computer Society, c1984-2012.
    • 1984-2012
    • 3 Items
    FormatCall NumberItem Location
    Text TK7885.A1 I54 vol. 5 1988Off-site
    FormatCall NumberItem Location
    Text TK7885.A1 I54 vol. 12-13 1995-1996Off-site
    FormatCall NumberItem Location
    Text TK7885.A1 I54 vol. 14-15 1997-1998Off-site

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