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  • LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey / sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.

    • Text
    • New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 83-273Offsite

  • Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 / sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.

    • Text
    • New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 83-274Offsite

  • Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.

    • Text
    • Silver Spring, MD : IEEE Computer Society Press, 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 84-138Offsite

  • Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 / sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.

    • Text
    • Los Angeles, CA (P.O. Box 80452, Los Angeles 90080) : The Society, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 83-572Offsite

  • Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983.

    • Text
    • Silver Spring, MD : IEEE Computer Society Press, c1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 84-137Offsite

  • The three faces of test : design, characterization, production : International Test Conference, 1984 : proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.

    • Text
    • Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 85-139Offsite

  • Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors / IEEE Computer Society [and] Test Technology Committee.

    • Text
    • Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 86-900Offsite

  • 1997 IEEE International Conference on Microelectronic Systems Education, MSE'97 : doing more with less in a rapidly changing environment, July 21-23, 1997, Arlington, Virginia, USA / sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with Association for Computing Machinery (ACM), the American Society for Engineering Education (ASEE) ; support provided by National Science Foundation, Semiconductor Research Corporation.

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society Press, 1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I3236 1997gOff-site

  • Digest of papers / International Test Conference.

    • Text
    • Los Angeles, CA : IEEE Computer Society Press, 1981-
    • 1981-1982
    • 2 Items
    FormatCall NumberItem Location
    Text TK7874 .I593 1981Off-site
    FormatCall NumberItem Location
    Text TK7874 .I593 1981Off-site

  • 1999 IEEE International Conference on Microelectronic Systems Education, MSE'99 : systems education in the 21st century, July 19-21, 1999, Arlington, Virginia, USA / sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI.

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society Press, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I3236 1999gOff-site

  • Proceedings / International Test Conference.

    • Text
    • Silver Spring, Md. : IEEE Computer Society Press, 1983-
    • 1983-present
    • 26 Items
    FormatCall NumberItem Location
    Text TK7874 .I6 2002Off-site
    FormatCall NumberItem Location
    Text TK7874 .I6 2003Off-site
    FormatCall NumberItem Location
    Text TK7874 .I6 2003Off-site

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  • 2001 IEEE International Conference on Microelectronic Systems Education, MSE'01 : designig microsystems in the New Millennium , June 17-18, 2001, Las Vegas, Nevada, USA / sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI.

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society Press, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I3236 2001gOff-site

  • Digest of papers ... Semiconductor Test Conference.

    • Text
    • New York : Institute of Electrical and Electronics Engineers, 1978.
    • 1978-1978
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .S42 1978Off-site

  • Digest of papers, ... Test Conference.

    • Text
    • New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : Available from IEEE Computer Society Publications Office, ©1979-1980.
    • 1979-1980
    • 2 Items
    FormatCall NumberItem Location
    Text TK7874 .S431 (1980)Off-site
    FormatCall NumberItem Location
    Text TK7874 .S431 (1979)Off-site

  • Proceedings / IEEE Workshop on Simulation & Test Generation Environments.

    • Text
    • Washington, D.C. : IEEE Computer Society Press, 1986-
    • 1985-present
    • 1 Item
    FormatCall NumberItem Location
    Text TK7895.A8 I223 1985-1986Off-site

  • Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 / IEEE Computer Society Test Technology Committee.

    • Text
    • Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, [1983], ©1983.
    • 1983-1983
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .C86 1983Off-site

  • VLSI system test, cost versus quality : 1990 IEEE VLSI Test Symposium April 10-11, 1990, Bally's Park Place Casino Hotel, Atlantic City, NJ / IEEE Philadelphia Section, IEEE Computer Society, Test Technology Committee.

    • Text
    • Atlantic City, NJ : IEEE Computer Society, 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I325 1990gOff-site

  • Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 / sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.

    • Text
    • New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .T45 1980Off-site

  • Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982 / presented by the Test Technology Committee, the International Test Formation [i.e. Foundation] ; sponsored by IEEE Computer Society, IEEE Philadelphia Section.

    • Text
    • Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I593 1982Off-site

  • The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.

    • Text
    • Silver Spring, MD : IEEE Computer Society Press, ©1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I593 1984Off-site

  • Proceedings / IEEE 1985 Workshop on Simulation & Test Generation Environments, September 17 & 18, 1985, San Francisco, California ; sponsors, IEEE Computer Society [and] Test Technology Committee.

    • Text
    • Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I3275 1985Off-site

  • Proceedings of the 1st European Test Conference, Paris, April 12-14 1989.

    • Text
    • Washington, D.C. : IEEE Computer Society, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .E87 1989Off-site

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