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Displaying 1-50 of 119 results
The use of the scanning electron microscope, by J. W. S. Hearle, J. T. Sparrow, and P. M. Cross.
- Text
- Oxford, New York, Pergamon Press [1972]
- 1972
- 1 Item
Item details Format Call Number Item Location Text JSF 73-283 Offsite The Scanning electron microscope.
- Text
- London, Cambridge University Press, 1972-
- 1972-present
- 1 Item
Item details Format Call Number Item Location Text JSK 87-116 Offsite Scanning electron microscopy.
- Text
- Chicago.
- 30 Items
Item details Format Call Number Item Location Text JSP 73-797 v. 4 (1985) Offsite Item details Format Call Number Item Location Text JSP 73-797 v. 10, pt. 1 (1977) Offsite Item details Format Call Number Item Location Text JSP 73-797 v. 10, pt. 2 (1977) Offsite The scanning electron microscope: world of the infinitely small [by] C. P. Gilmore.
- Text
- Greenwich, Conn., New York Graphic Society [1972]
- 1972
- 1 Item
Item details Format Call Number Item Location Text JSG 74-43 Offsite Scanning electron microscopy: systematic and evolutionary applications; proceedings of an international symposium held at the Dept. of Botany, University of Reading. Edited by V. H. Heywood.
- Text
- London, New York, Academic Press, 1971.
- 1971
- 1 Item
Item details Format Call Number Item Location Text JSE 74-1546 Offsite Principles and techniques of scanning electron microscopy; biological applications edited by M. A. Hayat.
- Text
- New York, Van Nostrand Reinhold Co. 1974-[77]
- 1974-1977
- 6 Items
Item details Format Call Number Item Location Text JSK 75-99 Library has: Vol. 1-4, 6-7. v. 4 Offsite Item details Format Call Number Item Location Text JSK 75-99 Library has: Vol. 1-4, 6-7. v. 6 Offsite Item details Format Call Number Item Location Text JSK 75-99 Library has: Vol. 1-4, 6-7. v. 7 Offsite Scanning electron microscopy [by] Oliver C. Wells, with portions contributed by Alan Boyde, Eric Lifshin [and] Alex Rezanowich.
- Text
- New York, McGraw-Hill [1974]
- 1974
- 1 Item
Item details Format Call Number Item Location Text JSE 75-263 Offsite Les soies cuticulaires des Megachilidae (Hy,enoptera Apoïdea) vues au microscope électronique à balayage. [Par] Jean J. Pasteels & Jacques M. Pasteels.
- Text
- Bruxelles, Palais des Académies, 1972.
- 1972
- 1 Item
Item details Format Call Number Item Location Text *EM A178 t. 18, fasc. 1 v. 18 part 1-3 Offsite Quantitative scanning electron microscopy / edited by D. B. Holt ... [et al.].
- Text
- London ; New York : Academic Press, 1974.
- 1974
- 1 Item
Item details Format Call Number Item Location Text JSE 75-907 Offsite Rasterelektronenmikroskopie; eine Einführung für Mediziner und Biologen [von] J. Ohnsorge [und] R. Holm. Scanning electron microscopy.
- Text
- Stuttgart, G. Thieme, 1973.
- 1973
- 1 Item
Item details Format Call Number Item Location Text JSD 75-493 Offsite Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart.
- Text
- New York : Plenum Press, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSE 77-34 Offsite The unseen universe; photographs from the scanning electron microscope [by] C. P. Gilmore.
- Text
- New York, Schocken Books [1974, c1972]
- 1974
- 1 Item
Item details Format Call Number Item Location Text JSG 78-31 Offsite Magnifications : photography with the scanning electron microscope / David Scharf.
- Text
- New York : Schocken Books, 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSG 78-75 Offsite Scanning electron microscopy in the study of sediments / edited by W. Brian Whalley.
- Text
- Norwich : Geo Abstracts Ltd., 1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSE 80-1374 Offsite Scanning.
- Text
- New York : Gerhard Witzstrock Pub. House Inc., 1978-
- 1978-present
- 8 Items
Item details Format Call Number Item Location Text JSP 84-134 v. 11 (1989) Offsite Item details Format Call Number Item Location Text JSP 84-134 v. 12 (1990) Offsite Item details Format Call Number Item Location Text JSP 84-134 v. 13 (1991) Offsite Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists / Joseph I. Goldstein ... [et al.]
- Text
- New York : Plenum Press, c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSE 82-329 Offsite Electron microscopy of soils and sediments : examples / Peter Smart and N. Keith Tovey.
- Text
- Oxford [Oxfordshire] : Clarendon Press, 1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSF 82-238 Offsite Scanned image microscopy / edited by Eric A. Ash.
- Text
- London ; New York : Academic Press, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text JSE 82-120 Offsite SEM : a user's manual for materials science / Barbra L. Gabriel.
- Text
- Metals Park, Ohio : American Society for Metals, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSF 87-9 Offsite Advanced scanning electron microscopy and X-ray microanalysis / Dale E. Newbury ... [et al.].
- Text
- New York : Plenum Press, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSE 87-1896 Offsite Clastic particles : scanning electron microscopy and shape analysis of sedimentary and volcanic clasts / edited by John R. Marshall.
- Text
- New York : Van Nostrand Reinhold Co., c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text JSF 88-926 Offsite Scanning electron microscopy in archaeology / edited by Sandra L. Olsen.
- Text
- Oxford, England : B.A.R., 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JFG 90-167 Schwarzman Building - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
The operation of transmission and scanning electron microscopes / Dawn Chescoe and Peter J. Goodhew.
- Text
- Oxford ; New York : Oxford University Press ; Oxford : Royal Microscopical Society, 1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text JSE 91-146 Offsite Electron beam testing technology / edited by John T.L. Thong.
- Text
- New York : Plenum Press, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSF 94-431 Offsite The measurement of grain boundary geometry / V. Randle.
- Text
- Bristol ; Philadelphia : Institute of Physics Pub., c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSE 96-1422 Offsite Microcantilevers for atomic force microscope data storage / by Benjamin W. Chui.
- Text
- Boston, Mass. : Kluwer Academic Publishers, 1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text JSE 99-235 Offsite Introduction to biological scanning electron microscopy / M. A. Hayat.
- Text
- Baltimore : University Park Press, c1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSE 99-1550 Offsite Magnetic imaging and its applications to materials / edited by Marc De Graef and Yimei Zhu.
- Text
- San Diego : Academic Press, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text JSE 00-2104 Offsite Rasterelektronenmikroskopische Untersuchungen von Metallschäden / L. Engel und H. Klingele.
- Text
- München : Carl Hanser, 1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text ReCAP 11-412 Offsite SEM Sentinel [microform] : SEM performance measurement system / Alice V. Ling ... [et al.].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000-
- 2000-present
Scanning microscopy [electronic resource].
- Text
- Chicago : Scanning Microscopy International, ©1987-1996.
- 1987-1996
- 1 Resource
Available Online
http://WU9FB9WH4A.search.serialssolutions.com/?V=1.0&L=WU9FB9WH4A&S=JCs&C=TC0000387598&T=marcScanning microscopy instrumentation : 22-23 July 1991, San Diego, California / Gordon S. Kino, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S325 1992g Off-site An atlas of metal damage : surface examination by scanning electron microscope / Lothar Engel, Hermann Klingele ; translated by Stewart Murray.
- Text
- Englewood Cliffs, N.J. : Prentice-Hall, 1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text TN690 .E513 Off-site Scanning probe microscopies : 20-22 January 1992, Los Angeles, California / Srinivas Manne, chair/editor.
- Text
- Bellingham, Wash., USA : SPIE, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S34 1992g Off-site Scanned image microscopy / edited by Eric A. Ash.
- Text
- London ; New York : Academic Press, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S25 Off-site Chemical microanalysis : using electron beams / I.P. Jones.
- Text
- London : The Institute of Materials, 1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text QD117.E42 J66 1992g Off-site Electron beam testing technology / edited by John T.L. Thong.
- Text
- New York : Plenum Press, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .E426 1993 Off-site Biological scanning electron microscopy / Barbra L. Gabriel.
- Text
- New York : Van Nostrand Reinhold Co., c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 G3 1982 Off-site Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California / Clayton C. Williams, chair/editor.
- Text
- Bellingham, Wash., USA : SPIE, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S34 1993g Off-site Fiziko-khimicheskie metody analiza mineralov / otv. redaktory, T. S. I︠U︡supov, D. K. Arkhipenko.
- Text
- Novosibirsk : Nauka, Sib. otd-nie, 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text QE1 .Ak3525 vyp.314-317 Off-site Integrated circuit metrology, inspection, and process control IX : 20-22 February 1995, Santa Clara, California / Marylyn H. Bennett, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEMI--Semiconductor Equipment and Materials International.
- Text
- Bellingham, Wash., USA : SPIE, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I58 1995g Off-site Scanning electron microscopy [by] Oliver C. Wells, with portions contributed by Alan Boyde, Eric Lifshin [and] Alex Rezanowich.
- Text
- 1974
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 W44 Off-site Scanning electron microscopy in the study of sediments / edited by W. Brian Whalley.
- Text
- Norwich, Eng, : Geo Abstracts, 1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text QE472 .S95 1977 Off-site Microcantilevers for atomic force microscope data storage / by Benjamin W. Chui.
- Text
- Boston, Mass. : Kluwer Academic Publishers, 1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text TA1635 .C48 1999 Off-site Biomedical research applications of scanning electron microscopy / edited by Gisele M. Hodges and Richard C. Hallowes.
- Text
- 1979-present
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 B56 v.1 Off-site The use of the scanning electron microscope / by J. W. S. Hearle, J. T. Sparrow, and P. M. Cross.
- Text
- Oxford ; New York : Pergamon Press, [1972]
- 1972
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 H4 1972 Off-site The Scanning electron microscope.
- Text
- London : Cambridge University Press, 1972-
- 1972-present
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S27 Off-site Magnetic imaging and its applications to materials / edited by Marc De Graef and Yimei Zhu.
- Text
- San Diego : Academic Press, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text QC762.6.M34 M34 2001g Off-site Preparation of biological specimens for scanning electron microscopy / compiled by Judith A. Murphy and Godfried M. Roomans.
- Text
- AMF O'Hare [Chicago] Ill. : Scanning Electron Microscopy, Inc., [1984], ©1984.
- 1984-1984
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 M8 1984 Off-site Semiconductor measurement technology : notes on SEM examination of microelectronic devices / John R. Devaney, K. O. Leedy and W. J. Keery.
- Text
- Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-35 Off-site
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