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  • Ion formation from organic solids : proceedings of the second international conference, Münster, Fed. Rep. of Germany, September 7-9, 1982 / editor, A. Benninghoven.

    • Text
    • Berlin ; New York : Springer-Verlag, 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 84-188Offsite

  • Secondary ion mass spectrometry : SIMS III : proceedings of the third international conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 / editors, A. Benninghoven ... [et al.].

    • Text
    • Berlin ; New York : Springer Verlag, 1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 84-127Offsite

  • Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors, A. Benninghoven ... [et al.].

    • Text
    • Berlin ; New York : Springer-Verlag, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 85-217Offsite

  • Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 / editors, A. Benninghoven ... [et al.].

    • Text
    • Berlin ; New York : Springer-Verlag, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 86-1197Offsite

  • Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner.

    • Text
    • New York : J. Wiley, 1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text PMB (Chemical analysis (Series). v. 86)Offsite

  • Handbook of static secondary ion mass spectrometry / D. Briggs, A. Brown, and J.C. Vickerman.

    • Text
    • Chichester [West Sussex] ; New York : J. Wiley, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSG 90-23Offsite

  • Secondary ion mass spectroscopy of solid surfaces / V. Cherepin.

    • Text
    • Utrecht, The Netherlands : VNU Science Press, 1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 89-1495Offsite

  • Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis / R.G. Wilson, F.A. Stevie, C.W. Magee.

    • Text
    • New York : Wiley, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 90-539Offsite

  • Ion formation from organic solids (IFOS IV) : mass spectrometry of involatile material : proceedings of the fourth international conference, Münster, Federal Republic of Germany, September 21-23, 1987 / editor, A. Benninghoven.

    • Text
    • Chichester [England] ; New York : Wiley, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 90-1226Offsite

  • Secondary ion mass spectrometry : Proceedings of the Sixth International Conference on Secondary Ion Mass Spectromety (SIMS VI), Palais des Congrēs, Versailles, Paris, France, September 13-18th, 1987 / editors, A. Benninghoven, A.M. Huber, H.W. Werner.

    • Text
    • Chichester [England] ; New York : Wiley, c1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 88-1026Offsite

  • Ion formation from organic solids (IFOS V) : proceedings of the fifth international conference, Lövånger, Sweden, June 18-21, 1989 / editors, A. Hedin, B.U.R. Sundqvist, A. Benninghoven.

    • Text
    • Chichester [England] ; New York : Wiley, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 91-1564Offsite

  • Secondary ion mass spectrometry, SIMS VIII : proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry (SIMS VIII), International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 / editors, A. Benninghoven ... [et al.].

    • Text
    • Chichester ; New York : J. Wiley, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 93-1601Offsite

  • Analysis of LDEF experiment AO187-2 chemical and isotopic measurements of micrometeoroids by secondary ion mass spectrometry [microform] : final report NAG1-1174 to the National Aeronautics and Space Administration ; principal investigator, Ernst Zinner.

    • Text
    • [Washington, D.C. : The Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995

  • Secondary ion mass spectrometry : principles and applications / edited by John C. Vickerman, Alan Brown, and Nicola M. Reed.

    • Text
    • Oxford [England] : Clarendon Press ; New York : Oxford University Press, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 90-69Offsite

  • Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center [microform] / Carlos Vargas-Aburto, Paul R. Aron, and Dale R. Liff.

    • Text
    • [Washington, D.C.] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1990]
    • 1990
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS68966

  • New trends and potentialities of ToF-SIMS in surface studies / Jacek Grams.

    • Text
    • New York : Nova Science Publishers, c2007.
    • 2007
    • 1 Item

    Available Online

    http://www.loc.gov/catdir/toc/ecip0711/2007007204.html
    FormatCall NumberItem Location
    Text JSF 07-808Offsite

  • Ion spectroscopies for surface analysis / edited by A.W. Czanderna and David M. Hercules.

    • Text
    • New York : Plenum Press, [1991], ©1991.
    • 1991-1991
    • 1 Item
    FormatCall NumberItem Location
    Text QC176.8.S8 I66 1991Off-site

  • Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 / edited by K. F. J. Heinrich and D. E. Newbury.

    • Text
    • Washington : U.S. Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.M3 W67 1974Off-site

  • Ion formation from organic solids : proceedings of the second international conference, Münster, Fed. Rep. of Germany, September 7-9, 1982 / editor, A. Benninghoven.

    • Text
    • Berlin ; New York : Springer-Verlag, 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text QC702.7.E4 I57 1983Off-site

  • Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors: A. Benninghoven [and others].

    • Text
    • Berlin ; New York : Springer-Verlag, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.S43 I58 1983Off-site

  • Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 / editors, A. Benninghoven [and others].

    • Text
    • Berlin ; New York : Springer-Verlag, [1986], ©1986.
    • 1986-1986
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.S43 I58 1985Off-site

  • Desorption mass spectrometry : are SIMS and FAB the same? / Philip A. Lyon, editor.

    • Text
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.M3 D47 1985Off-site

  • Ion formation from organic solids (IFOS III) : mass spectrometry of involatile material : proceedings of the third international conference, Münster, Fed. Rep. of Germany, September 16-18, 1985 / editor, A. Benninghoven.

    • Text
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text QC702.7.E4 I55 1985Off-site

  • Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner.

    • Text
    • New York : J. Wiley, 1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.S43 B46 1987Off-site

  • Surface analysis of polymers by XPS and static SIMS / D. Briggs.

    • Text
    • Cambridge, U.K. ; New York : Cambridge University Press, 1998.
    • 1998
    • 2 Items
    FormatCall NumberItem Location
    Text Off-site
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text QD381.9.S97 B75 1998Off-site

  • Ion formation from organic solids (IFOS IV) : mass spectrometry of involatile material : proceedings of the fourth international conference, Münster, Federal Republic of Germany, September 21-23, 1987 / editor, A. Benninghoven.

    • Text
    • Chichester ; New York : Wiley, [1989], ©1989.
    • 1989-1989
    • 1 Item
    FormatCall NumberItem Location
    Text QC702.7.E4 I56 1989Off-site

  • Handbook of static secondary ion mass spectrometry / D. Briggs, A. Brown, and J.C. Vickerman.

    • Text
    • Chichester [West Sussex] ; New York : J. Wiley, [1989], ©1989.
    • 1989-1989
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.S43 B75 1989Off-site

  • Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis / R.G. Wilson, F.A. Stevie, C.W. Magee.

    • Text
    • New York : Wiley, [1989], ©1989.
    • 1989-1989
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.S43 W55 1989Off-site

  • Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors: A. Benninghoven, J. Okana, R. Shimizu, and H.W. Werner.

    • Text
    • Berlin ; New York : Springer-Verlag, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.S43 I58 1984Off-site

  • Desorption mass spectrometry : are SIMS and FAB the same? / Philip A. Lyon, editor ; developed from a symposium sponsored by 3M, ... [et. al.], St.Paul, Minnesota, October 7-10, 1984.

    • Text
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.M3 D47 1985Off-site

  • Handbook of static secondary ion mass spectrometry / D. Briggs, A. Brown, and J.C. Vickerman.

    • Text
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.S43B75 1989qOff-site

  • Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors: A. Benninghoven [and others].

    • Text
    • Berlin ; New York : Springer-Verlag, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.S43 I58 1984Off-site

  • Desorption mass spectrometry : are SIMS and FAB the same? / Philip A. Lyon, editor ; developed from a symposium sponsored by 3M, ... [et. al.], St.Paul, Minnesota, October 7-10, 1984.

    • Text
    • Washington, D.C. : American Chemical Society, 1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.M3 D47 1985Off-site

  • Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 / editors, A. Benninghoven [and others].

    • Text
    • New York : Springer-Verlag, 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text QD96.M3 I57 1979Off-site

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