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Displaying 1-50 of 94 results
The semiconductor memory data book for design engineers / [the engineering staff of Texas Instruments Incorporated, Semiconductor Group]. 1st ed.
- Text
- [Dallas] : TI, c1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSF 77-866 Offsite A user's handbook of semiconductor memories / Eugene R. Hnatek.
- Text
- New York : Wiley, c1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSF 77-974 Offsite The semiconductor memory book / Intel Marketing Communications.
- Text
- New York : Wiley, c1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSF 79-369 Offsite Digest of papers.
- Text
- New York, Institute of Electrical and Electronics Engineers.
- 197-1978
- 4 Items
Item details Format Call Number Item Location Text JSP 79-42 1976 Offsite Item details Format Call Number Item Location Text JSP 79-42 1977 Offsite Item details Format Call Number Item Location Text JSP 79-42 1978 Offsite Handbook of semiconductor and bubble memories / Walter A. Triebel, Alfred E. Chu.
- Text
- Englewood Cliffs, N.J. : Prentice-Hall, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text JSE 81-1548 Offsite The MOS memory data for design engineers, 1980.
- Text
- [Houston, Tex.]: Texas Instruments, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text JSE 81-1310 Offsite Semiconductor memories / Betty Prince, Gunnar Due-Gundersen.
- Text
- Chichester [West Sussex] ; New York : Wiley, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSE 85-561 Offsite Dynamic semiconductor RAM structures : a patent-oriented survey / A. Cardon and L.J.L. Fransen.
- Text
- McLean, VA, USA : Pergamon International Information Corp. ; Oxford [Oxfordshire] ; New York : Pergamon Press, 1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text *VBN 85-4530 Offsite Nonvolatile semiconductor memory technology : a comprehensive guide to understanding and to using NVSM devices / edited by William D. Brown, Joe E. Brewer.
- Text
- New York : IEEE Press, c1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text JSF 98-145 Offsite High performance memories : new architecture DRAMs and SRAMs--evolution and function / Betty Prince.
- Text
- Chichester ; New York : Wiley, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSF 00-343 Offsite Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.
- Text
- Boston ; London : Kluwer Academic, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Text JSF 01-68 Offsite Advanced semiconductor memories : architectures, designs, and applications / Ashok K. Sharma.
- Text
- Piscataway, NJ : IEEE Press ; Hoboken, NJ : Wiley-Interscience, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text JSE 02-2044 Offsite High performance memory testing : design principles, fault modeling, and self-test / R. Dean Adams.
- Text
- Boston : Kluwer Academic, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text JSE 02-2049 Offsite Memory architecture exploration for programmable embedded systems / Peter Grun, Nikil Dutt, Alex Nicolau.
- Text
- Boston ; London : Kluwer Academic Publishers, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text JSE 03-360 Offsite Proceedings : Board and system test track / International Test Conference 2003 ; [30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA ; sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
- Text
- Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text JSF 05-139 Offsite Nonvolatile semiconductor memories : technologies, design, and applications / edited by Chenming Hu.
- Text
- New York : Institute of Electrical and Electronics Engineers, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 N63 1991 Off-site Digital MOS integrated circuits II : with applications to processors and memory design / edited by Mohamed I. Elmasry.
- Text
- Piscataway, NJ : IEEE Press, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text TK7874 .D5353 1992 Off-site Testing semiconductor memories : theory and practice / A.J. van de Goor.
- Text
- Chichester ; New York : J. Wiley & Sons, 1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 G655 1991 Off-site Semiconductor memories : a handbook of design, manufacture, and application / Betty Prince.
- Text
- Chichester ; New York : Wiley, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 P74 1991 Off-site Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I334 1993g Off-site 1994 Semiconductor Manufacturing Technology Workshop : Apr. 18-19, 1994, Hsinchu, Taiwan, R.O.C. / [organized by] IEEE Electron Devices Society Taipei Chapter.
- Text
- [Hsinchu, Taiwan] : [ERSO, ITRI], [1994]
- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7836 .S46 1994g Off-site Semiconductor Manufacturing Technology Workshop : Mar. 22-26, 1993, Hsinchu, Taiwan, R.O.C. / [sponsored by] IEEE Electron Devices Society,IEEE Control Systems Society [and others].
- Text
- [Hsinchu, Taiwan?] : [ERSO, ITRI?], [1993?]
- 1993
- 2 Items
Item details Format Call Number Item Location Text TK7836 .S46 1993g v.2 Off-site Item details Format Call Number Item Location Text TK7836 .S46 1993g v.1 Off-site Records of the IEEE International Workshop on Memory Technology, Design and Testing, August 8-9, 1994, San Jose, California / edited by R. Rajsuman ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, in cooperation with the IEEE Computer Society Technical Committee on VLSI.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1994g Off-site Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 1995, San Jose, California / edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI in cooperation with the IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1995g Off-site Sixth biennial IEEE Nonvolatile Memory Technology Conference : June 24-26, 1996, Holiday Inn Pyramid, Albuquerque, New Mexico, USA / sponsored by the Institute of Electrical and Electronics Engineers, Components, Packaging, & Manufacturing Technology Society, IEEE Computer Society ; cooperative sponsorship from the IEEE Magnetics Society and the IEEE Solid State Circuits Council.
- Text
- [New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I33 1996g Off-site High performance memories : new architecture DRAMs and SRAMs : evolution and function / Betty Prince.
- Text
- Chichester, England ; New York : John Wiley, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 P68 1996 Off-site Semiconductor memories : technology, testing, and reliability / Ashok K. Sharma.
- Text
- Piscataway, N.J. : IEEE Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 S49 1997 Off-site Nonvolatile semiconductor memory technology : a comprehensive guide to understanding and to using NVSM devices / edited by William D. Brown, Joe E. Brewer.
- Text
- New York : IEEE Press, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 N634 1998 Off-site Proceedings : International Workshop on Memory Technology, Design, and Testing / edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1997g Off-site Digest of papers / International Test Conference.
- Text
- Los Angeles, CA : IEEE Computer Society Press, 1981-
- 1981-1982
- 2 Items
Item details Format Call Number Item Location Text TK7874 .I593 1981 Off-site Item details Format Call Number Item Location Text TK7874 .I593 1981 Off-site Semiconductor Manufacturing Technology Workshop : Oct. 19-20, 1995, Hsinchu, Taiwan, R.O.C. / [sponsored by] IEEE Electron Devices Society, IEEE Control Systems Society [and others].
- Text
- [Hsinchu, Taiwan] : [ERSO, ITRI?], [1995?]
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7836 .S46 1995g Off-site Semiconductor memories / Betty Prince, Gunnar Due-Gundersen.
- Text
- 1983
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 P74 1983 Off-site Memory technology, design and testing : proceedings : International Workshop on Memory Technology, Design, and Testing / sponsored by IEEE Computer Society [and others] ; edited by D. Lepejian [and others].
- Text
- Los Alamitos, California : IEEE Computer Society Press, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1998g Off-site Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore / edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1996g Off-site Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA / edited by R. Rajsuman and T. Wik ; sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, in cooperation with the IEEE Solid-State Circuits Society.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1999g Off-site High performance memories : new architecture DRAMs and SRAMs--evolution and function / Betty Prince.
- Text
- Chichester ; New York : Wiley, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 P73 1999 Off-site Seventh biennial IEEE Nonvolatile Memory Technology Conference : proceedings : 1998 conference : June 22-24, 1998, Albuquerque, NM, USA / sponsors: IEEE Components, Packaging, & Manufacturing Technology Society ; IEEE Computer Society.
- Text
- Piscataway, N.J. : IEEE, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I33 1998g Off-site Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California / edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
- Text
- Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 2000g Off-site Semiconductor memories / Jerry Eimbinder, editor. Contributors: Andrew R. Berding [and others]
- Text
- New York : Wiley-Interscience, [1971]
- 1971
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 S4 Off-site Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.
- Text
- Boston : Kluwer Academic, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TK7874.75 .B87 2000 Off-site DRAM circuit design : a tutorial / Brent Keeth, R. Jacob Baker.
- Text
- New York : IEEE, 2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 K425 2000 Off-site Proceedings : 2001 IEEE International Workshop on Memory Technology, Design and Testing : August 6-7, 2001, San Jose, California, USA / editors, Yervant Zorian [and others] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
- Text
- Los Alamitos, California : IEEE Computer Society, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 2001g Off-site Digest of papers ... Semiconductor Test Symposium.
- Text
- New York : Institute of Electrical and Electronics Engineers, 1974-1977.
- 1974-1977
- 4 Items
Item details Format Call Number Item Location Text TK7874 .S42 1976 Off-site Item details Format Call Number Item Location Text TK7874 .S42 1975 Off-site Item details Format Call Number Item Location Text TK7874 .S42 1974 Off-site Memory technology, design and testing : proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France / editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
- Text
- Los Alamitos, California : IEEE Computer Society, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 2002g Off-site Fault-tolerance and reliability techniques for high-density random-access memories / Kanad Chakraborty, Pinaki Mazumder.
- Text
- Upper Saddle River, NJ : Prentice Hall, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 C44 2002g Off-site Digest of papers ... Semiconductor Test Conference.
- Text
- New York : Institute of Electrical and Electronics Engineers, 1978.
- 1978-1978
- 1 Item
Item details Format Call Number Item Location Text TK7874 .S42 1978 Off-site Dynamic semiconductor RAM structures : a patent-oriented survey / A. Cardon and L.J.L. Fransen.
- Text
- 1984
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 C37 1984 Off-site Memory technology, design and testing : records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing : 28-29 July, 2003, San Jose, California / sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid-State Circuits Society.
- Text
- 2003
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 2003g Off-site Materials and processes for nonvolatile memories : symposium held November 340-December 2, 2004, Boston, Massachusetts, U.S.A. / editors, A. Claverie [and others].
- Text
- Warrendale, Pa. : Materials Research Society, [2005], ©2005.
- 2005-2005
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 M36 2004g Off-site Materials and processes for nonvolatile memories II : symposium held April 10-13, 2007, San Francisco, California, U.S.A. / editors, Tingkai Li [and others].
- Text
- Warrendale, Pa. : Materials Research Society, 2007.
- 2007
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 M36 2004g Off-site
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