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Displaying 1-50 of 53 results
A manual of quantitative electron probe microanalysis, by W. J. M. Salter; with the development of the computer program by E. R. Denton.
- Text
- London, Structural Publications Ltd., 1970.
- 1970
- 1 Item
Item details Format Call Number Item Location Text JSD 71-274 Offsite Electron probe microanalysis [by] L. S. Birks. 2d ed.
- Text
- New York, Wiley-Interscience [1971]
- 1971
- 1 Item
Item details Format Call Number Item Location Text PMB (Chemical analysis. [Series] v. 17) Offsite Elektronenstrahl-Mikroanalyse (ESMA) zur Untersuchung basischer feuerfester Stoffe [von] K. H. Obst, W. Münchberg [und] H. Malissa.
- Text
- Wien, New York, Springer, 1972.
- 1972
- 1 Item
Item details Format Call Number Item Location Text JSF 73-194 Offsite Microprobe analysis, edited by C. A. Andersen.
- Text
- New York, Wiley [1973]
- 1973
- 1 Item
Item details Format Call Number Item Location Text JSE 74-146 Offsite Proceedings.
- Text
- San Francisco [etc.]
- 3 Items
Item details Format Call Number Item Location Text JSP 74-3 1966-67 Offsite Item details Format Call Number Item Location Text JSP 74-3 1969-70 Offsite Item details Format Call Number Item Location Text JSP 74-3 1972-73 Offsite Electric probes in stationary and flowing plasmas: theory and application [by] Paul M. Chung, Lawrence Talbot [and] Kenell J. Touryan.
- Text
- New York, Springer-Verlag, 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSE 75-1092 Offsite Proceedings [of the] annual conference.
- Text
- Bethlehem, Pa.
- 6 Items
Item details Format Call Number Item Location Text JSP 77-60 v. 14 (1979) Offsite Item details Format Call Number Item Location Text JSP 77-60 v. 15 (1980) Offsite Item details Format Call Number Item Location Text JSP 77-60 v. 16 (1981) Offsite Advanced techniques in failure analysis.
- Text
- New York.
- unknown-present
- 4 Items
Item details Format Call Number Item Location Text JSP 79-188 1977 Offsite Item details Format Call Number Item Location Text JSP 79-188 1978 Offsite Item details Format Call Number Item Location PRINT JSP 79-188 Schwarzman Building - Main Reading Room 315 Not available - Please for assistance.Vth International Congress on X-ray Optics and Microanalysis, Tübingen, September 9th-14th, 1968, [proceedings] / edited by G. Möllenstedt and K. H. Gaukler.
- Text
- Berlin ; New York : Springer-Verlag, 1969.
- 1969
- 1 Item
Item details Format Call Number Item Location Text JSF 80-1063 Offsite Electron probe microanalysis : discussion of various correction factors / by S. M. Khera.
- Text
- Bombay : Bhabha Atomic Research Centre, 1973.
- 1973
- 1 Item
Item details Format Call Number Item Location Text *ZV-185 no. 58-74 Offsite Optique des rayons X et microanalyse, X-ray optics and microanalysis, IVe Congrès international sur l'optique des rayons X et la microanalyse, Orsay, [7-10] septembre 1965. Publié sous la direction de R. Castaing, P. Deschamps, J. Philibert --.
- Text
- Paris, Hermann, 1966.
- 1966
- 1 Item
Item details Format Call Number Item Location Text JSE 88-222 Offsite Quantitative electron microprobe analysis.
- Text
- Berlin, New York, Springer-Verlag, 1965.
- 1965
- 1 Item
Item details Format Call Number Item Location Text PMN (Theisen, R. Quantitative electron microprobe analysis) Offsite Using and understanding probes.
- Text
- Indianapolis, H. W. Sams [1960]
- 1960
- 1 Item
Item details Format Call Number Item Location Text TTE (Graf, R. F. Using and understanding probes) Offsite Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
- Text
- Philadelphia, American Society for Testing and Materials [1964]
- 1964
- 1 Item
Item details Format Call Number Item Location Text VEE (American Society for Testing Materials. Special technical publication. no. 349) Offsite Possible designs for electric-field-strength probes for millimeter waves / J. Randa, M. Kanda, D. Melquist.
- Text
- Boulder, Colo. : National Bureau of Standards, U.S. Dept. of Commerce, 1988.
- 1988
Evaluation and field validation of eddy-current array probes for steam generator tube inspection [microform] / prepared by C.V. Dodd, J.R. Pate.
- Text
- Washington, DC : Division of Engineering Technology, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission : Supt. of Docs., U.S. G.P.O. [distributor], 1996.
- 1996
Fast probing considerations for on-machine inspection of parts [microform] / Alice V. Ling, Neil D. Wilkin.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
- 1999
Measurement of air flow characteristics using seven-hole cone probes [microform] / Timothy T. Takahashi.
- Text
- Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center, [1997]
- 1997
Scanning probe microscopies : 20-22 January 1992, Los Angeles, California / Srinivas Manne, chair/editor.
- Text
- Bellingham, Wash., USA : SPIE, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S34 1992g Off-site Microbeam techniques : a short course sponsored by the Mineralogical Association of Canada and held immediately prior to their 1976 annual meeting, at the University of Alberta, Edmonton, Alberta, May 16th-18th / D. Barrie Clarke [and others].
- Text
- Edmonton : Mineralogical Association of Canada, 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text QE351 .M4 v.1-2 Off-site Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California / Clayton C. Williams, chair/editor.
- Text
- Bellingham, Wash., USA : SPIE, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S34 1993g Off-site Quantitative electron microprobe analysis.
- Text
- Berlin ; New York : Springer-Verlag, 1965.
- 1965
- 1 Item
Item details Format Call Number Item Location Text QD117.M5 T34 Off-site Symposium on X-Ray and Electron Probe Analysis ; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
- Text
- Philadelphia : American Society for Testing and Materials, [1964]
- 1964
- 1 Item
Item details Format Call Number Item Location Text QD95 .Sy68 1964 Off-site Optique des rayons X et microanalyse : X-ray optics and microanalysis, IVe Congrès international sur l'optique des rayons X et la microanalyse, Orsay, [7-10] septembre 1965 / Publié sous la direction de R. Castaing, P. Deschamps, J. Philibert ...
- Text
- Paris : Hermann, 1966.
- 1966
- 1 Item
Item details Format Call Number Item Location Text QD98 .I65 1965 Off-site Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics / A. Christou ; Naval Research Laboratory.
- Text
- Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-30 Off-site A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.
- Text
- Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-68 Off-site Eighth International Congress on X-ray Optics and Microanalysis / edited by Donald R. Beaman, Robert E. Ogilvie, and David B. Wittry.
- Text
- Midland, Mich. : Pendell Pub. Co., 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text QD79.M5 I57 1977 Off-site Elektronenstrahl-Mikroanalyse, von Hanns Malissa.
- Text
- Wien, New York, Springer-Verlag, 1966.
- 1966
- 1 Item
Item details Format Call Number Item Location Text QD98 .M3 Off-site Technology of proximal probe lithography / Christie R.K. Marrian, editor.
- Text
- Bellingham, Wash. : SPIE Optical Engineering Press, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text TK7874.8 .T43 1993 Off-site Proceedings. Edited by G. Shinoda, K. Kohra and T. Ichinokawa.
- Text
- [Tokyo] University of Tokyo Press [1972]
- 1972
- 1 Item
Item details Format Call Number Item Location Text QD79.M5 I57 1971 Off-site Unsteady effects on Langmuir probes at moderate frequencies.
- Text
- 1969.
- 1969
- 1 Item
Item details Format Call Number Item Location Text PRIN 685 1969 .171 Off-site Theory of an electrostatic probe in a stationary quiescent plasma.
- Text
- 1969.
- 1969
- 1 Item
Item details Format Call Number Item Location Text PRIN 685 1969 .249 Off-site A non-isothermal theory of an electrostatic probe in a weakly ionized gas.
- Text
- 1970.
- 1970
- 1 Item
Item details Format Call Number Item Location Text PRIN 685 1970 .504 Off-site Pressure distribution in the structure of a propagating current sheet.
- Text
- 1969.
- 1969
- 1 Item
Item details Format Call Number Item Location Text PRIN 685 1969 .989 Off-site Microprobe analyses of glasses from Apollo 14 sample 14156 / [A.M. Reid ... et al.].
- Text
- Houston, Tex. : The Center, 1971.
- 1971
- 1 Item
Item details Format Call Number Item Location Text QB592 .U61 Off-site Microprobe analyses of glasses and minerals from Luna - 16 soil / [R.W. Brown ... et al.].
- Text
- Houston, Tex. : The Center, 1971.
- 1971
- 1 Item
Item details Format Call Number Item Location Text QB592 .U62 Off-site Quantitative electron microprobe analysis.
- Text
- Berlin, New York, Springer-Verlag, 1965.
- 1965
- 1 Item
Item details Format Call Number Item Location Text 8378.899 Off-site Elektronenstrahl-Mikroanalyse (ESMA) zur Untersuchung basischer feuerfester Stoffe [von] K.H. Obst, W. Münchberg [und] H. Malissa.
- Text
- Wien, New York, Springer, 1972.
- 1972
- 1 Item
Item details Format Call Number Item Location Text TP838.O28 Off-site Probe measurements and determination of electron mobility in the positive column of low-pressure mercury-argon discharges / by W. Verweij.
- Text
- Eindhoven : N.V. Philips' Gloeilampenfabrieken, 1961.
- 1961
- 1 Item
Item details Format Call Number Item Location Text 8286.933 Off-site X-ray wavelength conversion tables and graphs for qualitative electron probe microanalysis [by] Kurt F.J. Heinrich and Mary Ann M. Giles.
- Text
- Washington, U.S. Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1967.
- 1967
- 1 Item
Item details Format Call Number Item Location Text 8294.444 Off-site Spectrochemical analysis: optical spectrometry, X-ray fluorescence spectrometry, and electron prope microanalysis techniques.
- Text
- Washington, For sale by the Superintendent of Documents, [U.S.] Govt. Print. Off.
- 1965-present
- 1 Item
Item details Format Call Number Item Location Text 8378 .923 Off-site A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.
- Text
- Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-68 Off-site Scanning probe microscopies : 20-22 January 1992, Los Angeles, California / Srinivas Manne, chair/editor.
- Text
- 1992
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S227 1992 Off-site Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California / Clayton C. Williams, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- 1993
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S2272 1993 Off-site Scanning probe microscopies III : 6-7 February 1995, San Jose, California / Mehdi Vaez-Iravani, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- 1995
- 1 Item
Item details Format Call Number Item Location Text QH212.S3 S2273 1995 Off-site Proceedings. Edited by G. Shinoda, K. Kohra and T. Ichinokawa.
- Text
- [Tokyo] University of Tokyo Press [1972]
- 1972
- 1 Item
Item details Format Call Number Item Location Text QD79.M5 I57 1971 Off-site Unsteady effects on Langmuir probes at moderate frequencies.
- Text
- 1969.
- 1969
- 1 Item
Item details Format Call Number Item Location Text PRIN 685 1969 .171 Off-site Theory of an electrostatic probe in a stationary quiescent plasma.
- Text
- 1969.
- 1969
- 1 Item
Item details Format Call Number Item Location Text PRIN 685 1969 .249 Off-site Microprobe analyses of glasses from Apollo 14 sample 14156 / [A.M. Reid ... et al.].
- Text
- Houston, Tex. : The Center, 1971.
- 1971
- 1 Item
Item details Format Call Number Item Location Text QB592 .U61 Off-site Probe measurements and determination of electron mobility in the positive column of low-pressure mercury-argon discharges / by W. Verweij.
- Text
- Eindhoven : N.V. Philips' Gloeilampenfabrieken, 1961.
- 1961
- 1 Item
Item details Format Call Number Item Location Text 8286.933 Off-site
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