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Displaying 1-14 of 14 results for author "Glembocki, O. J."
Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., U.S.A. : The Society, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S726 1992g Off-site Not available - Please for assistance.Diagnostic techniques for semiconductor materials processing : symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A. / editors, O.J. Glembocki [and others].
- Text
- Pittsburgh, Pa. : Materials Research Society, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .D497 1994 Off-site Not available - Please for assistance.Spectroscopic characterization techniques for semiconductor technology V : 25-26 March 1994, Los Angeles, California / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, Center for Advanced Technology for Ultrafast Photonic Materials and Applications, City University of New York.
- Text
- Bellingham, Wash., USA : SPIE, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S726 1994g Off-site Not available - Please for assistance.Nanoparticles and nanowire building blocks--synthesis, processing, characterization and theory : symposium held April 13-16, 2004, San Francisco, California, U.S.A. / editors, Orest J. Glambocki [and others].
- Text
- Warrendale, Pa. : Materials Research Society, [2004], ©2004.
- 2004-2004
- 1 Item
Item details Format Call Number Item Location Text QC611.8.N33 N37 2004g Off-site Not available - Please for assistance.Modern optical characterization techniques for semiconductors and semiconductor devices : 26-27 March 1987, Bay Point, Florida / O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1987], ©1987.
- 1987-1987
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .M58 1987g Off-site Not available - Please for assistance.Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California / Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society.
- Text
- Bellingham, Wash., USA : SPIE, [1988], ©1988.
- 1988-1988
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S725 1988g Off-site Not available - Please for assistance.Modern optical characterization techniques for semiconductors and semiconductor devices / O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
- Text
- 1987
- 1 Item
Item details Format Call Number Item Location Text TK7872.T55 M63 1987 Off-site Not available - Please for assistance.Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California / Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society.
- Text
- 1988
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S634 Off-site Not available - Please for assistance.Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- 1992
- 1 Item
Item details Format Call Number Item Location Text TK7871.85.S635 1992 Off-site Not available - Please for assistance.Spectroscopic characterization techniques for semiconductor technology V : 25-26 January 1994, Los Angeles, California / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering : cooperating organization-- Center for Advanced Technology for Ultrafast Photonic Materials and Applications, City University of New York.
- Text
- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S636 1994 Off-site Not available - Please for assistance.Modern optical characterization techniques for semiconductors and semiconductor devices / O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text TK7872.T55 M63 1987 Off-site Not available - Please for assistance.Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California / Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society.
- Text
- Bellingham, Wash., USA : SPIE, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S634 Off-site Not available - Please for assistance.Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S635 1992 Off-site Not available - Please for assistance.Spectroscopic characterization techniques for semiconductor technology V : 25-26 March 1994, Los Angeles, California / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, Center for Advanced Technology for Ultrafast Photonic Materials and Applications, City University of New York.
- Text
- Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S636 1994 Off-site Not available - Please for assistance.
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