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Displaying 1-17 of 17 results for author "Pollak, Fred H."
Modern optical characterization techniques for semiconductors and semiconductor devices : 26-27 March 1987, Bay Point, Florida / O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1987], ©1987.
- 1987-1987
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .M58 1987g Off-site Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California / Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society.
- Text
- Bellingham, Wash., USA : SPIE, [1988], ©1988.
- 1988-1988
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S725 1988g Off-site Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California / Fred H. Pollak, chairman/editor.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1985], ©1985.
- 1985-1985
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S725 1985 Off-site Surface and interface analysis of microelectronic materials processing and growth : 12-13 October 1989, Santa Clara, California / Leonard J. Brillson, Fred H. Pollak, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations: Center for Advanced Electronic Materials Processing/North Carolina State University, Engineering Research Center for Plasma-Aided Manufacturing/University of Wisconsin-Madison, SEMATECH.
- Text
- Bellingham, Wash., USA : SPIE--The International Society for Optical Engineering, [1990], ©1990.
- 1990-1990
- 1 Item
Item details Format Call Number Item Location Text TK7874 .S868 1990g Off-site International Conference on Modulation Spectroscopy : 19-21 March 1990, San Diego, California / Fred H. Pollak, Manuel Cardona, David E. Aspnes, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in cooperation with the Society of Vacuum Coaters.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1990], ©1990.
- 1990-1990
- 1 Item
Item details Format Call Number Item Location Text QC611 .I57 1990g Off-site Spectroscopic characterization techniques for semiconductor technology : 9-10 November 1983, Cambridge, Massachusetts / Fred H. Pollak, Robert S. Bauer, chairmen/editors.
- Text
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S63 Off-site Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California / Fred H. Pollak, chairman-editor.
- Text
- 1985
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S633 Off-site Modern optical characterization techniques for semiconductors and semiconductor devices / O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
- Text
- 1987
- 1 Item
Item details Format Call Number Item Location Text TK7872.T55 M63 1987 Off-site Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California / Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society.
- Text
- 1988
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S634 Off-site Surface and interface analysis of microelectronic materials processing and growth : 12-13 October 1989, Santa Clara, California / Leonard J. Brillson, Fred H. Pollak, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations: Center for Advanced Electronic Materials Processing/North Carolina State University, Engineering Research Center for Plasma-Aided Manufacturing/University of Wisconsin-Madison, SEMATECH.
- Text
- 1990
- 1 Item
Item details Format Call Number Item Location Text TK7874.S973 Off-site International Conference on Modulation Spectroscopy : 19-21 March 1990, San Diego, California / Fred H. Pollak, Manuel Cardona, David E. Aspnes, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in cooperation with the Society of Vacuum Coaters.
- Text
- 1990
- 1 Item
Item details Format Call Number Item Location Text QC611.I57 1990 Off-site Spectroscopic characterization techniques for semiconductor technology : 9-10 November 1983, Cambridge, Massachusetts / Fred H. Pollak, Robert S. Bauer, chairmen/editors.
- Text
- Bellingham, Wash., USA : SPIE--International Society for Optical Engineering, ©1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S63 Off-site Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California / Fred H. Pollak, chairman/editor.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S633 Off-site Modern optical characterization techniques for semiconductors and semiconductor devices / O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text TK7872.T55 M63 1987 Off-site Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California / Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society.
- Text
- Bellingham, Wash., USA : SPIE, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S634 Off-site Surface and interface analysis of microelectronic materials processing and growth : 12-13 October 1989, Santa Clara, California / Leonard J. Brillson, Fred H. Pollak, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations: Center for Advanced Electronic Materials Processing, North Carolina State University, Engineering Research Center for Plasma-Aided Manufacturing, University of Wisconsin-Madison, SEMATECH.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text TK7874 .S973 Off-site International Conference on Modulation Spectroscopy : 19-21 March 1990, San Diego, California / Fred H. Pollak, Manuel Cardona, David E. Aspnes, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in cooperation with the Society of Vacuum Coaters.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text QC611 .I57 1990 Off-site
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