Research Catalog

  • Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1991.
    • 1991
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 92-1899Offsite
  • Stress-induced phenomena in metallization : First International Workshop, Ithaca, NY, 1991 / editors, Che-Yu Li, Paul Totta, Paul Ho.

    • Text
    • New York : American Institute of Physics, c 1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 92-2139Offsite
  • Electronic packaging materials science VI : symposium held April 27-30, 1992, San Francisco, California, U.S.A. / editors, Paul S. Ho ... [et al.].

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 93-1816Offsite
  • Stress-induced phenomena in metallization : second international workshop, Austin, TX, March 1993 / editors, Paul S. Ho, Che-Yu Li, Paul Totta.

    • Text
    • New York : American Institute of Physics, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 95-889Offsite
  • Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA June 1995 / editors, Paul S. Ho ... [et al.].

    • Text
    • New York : American Institute of Physics, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 96-1187Offsite
  • Stress-induced phenomena in metallization : Fourth International Workshop, Tokyo, Japan, June, 1997 / editors, Hidekazu Okabayashi, Shoso Shingubara, Paul S. Ho.

    • Text
    • Woodbury, N.Y. : AIP Press, c1998.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 98-793Offsite
  • Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas 14-16 June 2004 / editors, Paul S. Ho ... [et al.].

    • Text
    • Melville, N.Y. : American Institute of Physics, 2004.
    • 2004
    • 1 Item

    Available Online

    http://proceedings.aip.org/proceedings/confproceed/741.jsp
    FormatCall NumberItem Location
    Text JSE 05-553Offsite
  • Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA / editors, R.J. Nemanich, P.S. Ho, S.S. Lau.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-260Offsite
  • Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1991], ©1991.
    • 1991-1991
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3443 1991Off-site
  • Electronic packaging materials science VI : symposium held April 27-30, 1992, San Francisco, California, U.S.A. / editors, Paul S. Ho [and others].

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7870.15 .E423 1992Off-site
  • Stress-induced phenomena in metallization : first international workshop, Ithaca, NY, 1991 / editors, Che-Yu Li, Paul Tolta, Paul S. Ho.

    • Text
    • New York : American Institute of Physics, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S765 1992Off-site
  • Stress-induced phenomena in metallization : second international workshop, Austin, TX, March 1993 / editors, Paul S. Ho, Che-Yu Li, Paul Totta.

    • Text
    • New York : American Institute of Physics, [1994], ©1994.
    • 1994-1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S765 1994Off-site
  • Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA June 1995 / editors, Paul S. Ho [and others].

    • Text
    • New York : American Institute of Physics, [1996], ©1996.
    • 1996-1996
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S765 1996Off-site
  • Stress-induced phenomena in metallization : Fourth International Workshop, Tokyo, Japan, June, 1997 / editors, Hidekazu Okabayashi, Shoso Shingubara, Paul S. Ho.

    • Text
    • Woodbury, N.Y. : AIP Press, [1998], ©1998.
    • 1998-1998
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S765 1997Off-site
  • Low dielectric constant materials for IC applications / P.S. Ho, J. Leu, W.W. Lee (eds.).

    • Text
    • Berlin ; New York : Springer, [2003], ©2003.
    • 2003-2003
    • 1 Item
    FormatCall NumberItem Location
    Text TK3401 .L69 2003Off-site
  • Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA / editors, R.J. Nemanich, P.S. Ho, S.S. Lau.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1986], ©1986.
    • 1986-1986
    • 1 Item
    FormatCall NumberItem Location
    Text QC176.84.S93 T49 1986Off-site
  • Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas 14-16 June 2004 / editors, Paul S. Ho [and others].

    • Text
    • Melville, N.Y. : American Institute of Physics, 2004.
    • 2004
    • 2 Items
    FormatCall NumberItem Location
    Text Off-site
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text QC611 .S87 2004Off-site
  • Diffusion phenomena in thin films and microelectronic materials / edited by Devendra Gupta and Paul S. Ho.

    • Text
    • Park Ridge, N.J., U.S.A. : Noyes Publications, [1988], ©1988.
    • 1988-1988
    • 1 Item
    FormatCall NumberItem Location
    Text QC176.84.D54 D54 1988Off-site
  • Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA, June 1995 / editors, Paul S. Ho ... [et. al].

    • Text
    • New York : American Institute of Physics, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S767 1996Off-site
  • Stress induced phenomena in metallization : fourth international workshop : Tokyo, Japan : June 1997 / editors, Hidekazu Okabayashi, Shoso Shingubara, Paul S. Ho.

    • Text
    • Woodbury : American Institute of Physics, c1998.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S768 1998Off-site
  • Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas 14-16 June 2004 / editors, Paul S. Ho ... [et al.].

    • Text
    • Melville, N.Y. : American Institute of Physics, 2004.
    • 2004
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S768 2004Off-site
  • Stress-induced phenomena in metallization : Tenth International Workshop on Stress-Induced Phenomena in Metallization : Austin, Texas, 5-7 November 2008 / editors, Paul S. Ho, Shinichi Ogawa, Ehrenfried Zschech ; sponsoring organization, The University of Texas at Austin.

    • Text
    • Melville, N.Y. : American Institute of Physics, ; 2009.
    • 2009
    • 2 Items
    FormatCall NumberItem Location
    Text Off-site
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text TK7871.85 .I574 2008Off-site
  • Stress-induced phenomena in metallization : first international workshop, Ithaca, NY, 1991 / editors, Che-Yu Li, Paul Tolta, Paul S. Ho.

    • Text
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S765 1992Off-site
  • Stress-induced phenomena in metallization : second international workshop, Austin, TX, March 1993 / editors, Paul S. Ho, Che-Yu Li, Paul Totta.

    • Text
    • New York : American Institute of Physics, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S766 1994Off-site
  • Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas, 14-16 June 2004 / editors, Paul S. Ho [and others].

    • Text
    • Melville, N.Y. : American Institute of Physics, 2004.
    • 2004
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S768 2004Off-site
  • Stress-induced phenomena in metallization : first international workshop, Ithaca, NY, 1991 / editors, Che-Yu Li, Paul Totta, Paul Ho.

    • Text
    • New York : American Institute of Physics, ©1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S765 1992Off-site
  • Stress-induced phenomena in metallization : second international workshop, Austin, TX, March 1993 / editors, Paul S. Ho, Che-Yu Li, Paul Totta.

    • Text
    • New York : American Institute of Physics, ©1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S766 1994Off-site

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