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  • Electro-diffusion of ions / Isaak Rubinstein.

    • Text
    • Philadelphia : Society for Industrial and Applied Mathematics, 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 91-1683Offsite
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  • Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1991.
    • 1991
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 92-1899Offsite

  • Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / editors, C.V. Thompson, J.R. Lloyd.

    • Text
    • Pittsburgh, Penn. : Materials Research Society, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 93-1387Offsite

  • Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A. / editors, Peter Børgesen ... [et al.].

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 95-591Offsite

  • Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A. / editors, Kenneth P. Rodbell ... [et al.].

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 94-1601Offsite

  • Advanced chromatographic and electromigration methods in biosciences / editor, Zdeněk Deyl ; co-editors, Ivan Miksik, Franco Tagliaro, Eva Tesărová.

    • Text
    • Amsterdam ; New York : Elsevier, 1998.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 98-1576Offsite

  • Stress induced phenomena in metallization : fifth international workshop, Stuttgart, Germany, June, 1999 / editors, Oliver Kraft, Eduard Arzt, Cynthia A. Volkert.

    • Text
    • Woodbury, N.Y. : American Institute of Physics, c1999.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 99-2270Offsite

  • Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1991], ©1991.
    • 1991-1991
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3443 1991Off-site

  • Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / editors, C.V. Thompson, J.R. Lloyd.

    • Text
    • Pittsburgh, PA : Materials Research Society, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3442 1992Off-site

  • Submicrometer metallization : the challenges, opportunities, and limitations : 23-25 September 1992, San Jose, California / Thomas Kwok, Takamaro Kikkawa, Krishna Shenai, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [1993], ©1993.
    • 1993-1993
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .S845 1993gOff-site

  • Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A. / editors, Kenneth P. Rodbell [and others].

    • Text
    • Pittsburgh, Penn. : Materials Research Society, [1993], ©1993.
    • 1993-1993
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3442 1993Off-site

  • Electromigration and electronic device degradation / edited by Aris Christou.

    • Text
    • New York, NY, USA : Wiley, [1994], ©1994.
    • 1994-1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .E477 1994Off-site

  • Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A. / editors, Peter Børgesen [and others].

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1994], ©1994.
    • 1994-1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3442 1994Off-site

  • Stress induced phenomena in metallization : fifth international workshop, Stuttgart, Germany, June, 1999 / editors, Oliver Kraft, Eduard Arzt, Cynthia A. Volkert.

    • Text
    • Woodbury, N.Y. : American Institute of Physics, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S765 1999gOff-site

  • Proceedings of the Symposium on Electromigration of Metals and First International Symposium on Multilevel Metallization and Packaging / edited by J.R. Lloyd [and others].

    • Text
    • Pennington, NJ : Electrochemical Society, [1985], ©1985.
    • 1985-1985
    • 1 Item
    FormatCall NumberItem Location
    Text TN690 .S895 1984Off-site

  • Electro-diffusion of ions / Isaak Rubinstein.

    • Text
    • Philadelphia : Society for Industrial and Applied Mathematics, 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text QC702 .R78 1990Off-site

  • Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A. / editors, Anthony S. Oates ... [et al.].

    • Text
    • Pittsburgh, PA : Materials Research Society, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3445 1995Off-site

  • Electrotransport in metals and alloys, by J. N. Pratt and R. G. R. Sellors.

    • Text
    • Riehen, Trans Tech SA, 1973.
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text TN690 .P66Off-site

  • Stress induced phenomena in metallization : fifth international workshop, Stuttgart, Germany, June, 1999 / editors, Oliver Kraft ... [et al.].

    • Text
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S769 1999Off-site

  • Stress induced phenomena in metallization : sixth international workshop, Ithaca, New York, 25-27 July, 2002 / editors, Shefford P. Baker ... [et al.].

    • Text
    • Melville, N.Y. : American Institute of Physics, 2002.
    • 2002
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S768 2002Off-site

  • Electromigration in ULSI Interconnections / Cher Ming Tan.

    • Text
    • Singapore ; Hackensack, NJ : World Scientific, c2010.
    • 2010
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874.76 .T36 2010Off-site

  • Submicrometer metallization : the challenges, opportunities, and limitations : 23-25 September 1992, San Jose, California / Thomas Kwok, Takamaro Kikkawa, Krishna Shenai, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874.S925 1993Off-site

  • Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A. / editors, Peter Børgesen ... [et al.].

    • Text
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3444 1994Off-site

  • Stress induced phenomena in metallization : fifth international workshop, Stuttgart, Germany, June, 1999 / editors, Oliver Kraft [and others].

    • Text
    • Melville, N.Y. : American Institute of Physics, ©1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S769 1999Off-site

  • Stress-induced phenomena in metallization : Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001 / editors, Shefford P. Baker [and others].

    • Text
    • Melville, NY : American Institute of Physics, 2002.
    • 2002
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S768 2002Off-site

  • Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas, 14-16 June 2004 / editors, Paul S. Ho [and others].

    • Text
    • Melville, N.Y. : American Institute of Physics, 2004.
    • 2004
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S768 2004Off-site

  • Submicrometer metallization : the challenges, opportunities, and limitations : 23-25 September 1992, San Jose, California / Thomas Kwok, Takamaro Kikkawa, Krishna Shenai, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874.S925 1993Off-site

  • Stress-induced phenomena in metallization : second international workshop, Austin, TX, March 1993 / editors, Paul S. Ho, Che-Yu Li, Paul Totta.

    • Text
    • New York : American Institute of Physics, ©1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S766 1994Off-site

  • Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A. / editors, Peter Børgesen [and others].

    • Text
    • Pittsburgh, Pa. : Materials Research Society, ©1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3444 1994Off-site

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