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  • Microelectronic processing laboratory at NBS / Thomas F. Leedy, Yan M. Liu, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-53Off-site

  • A wafer chuck for use between -196 and 350C̊ / R. Y. Koyama and M. G. Beuhler, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-55Off-site

  • A reverse-bias safe operating area transistor tester / David W. Berning, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-54Off-site

  • A production-compatible microelectronic test pattern for evaluating photomask misalignment / T. J. Russell, D. A. Maxwell, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards ; sponsored by the National Bureau of Standards and Advanced Research Projects Agency.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-51Off-site

  • Spreading resistance analysis for silicon layers with nonuniform resistivity / David H. Dickey, Solecon Laboratories, and James R. Ehrstein, Electron Devices Division, Center for Electronics & Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-48Off-site

  • Reliability technology for cardiac pacemakers III : a workshop report : report of a workshop held at the National Bureau of Standards, Gaithersburg, MD, October 19-20, 1977 / Harry A. Schafft, editor, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-50Off-site

  • An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices / David L. Blackburn, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-52Off-site

  • Accurate linewidth measurements on integrated-circuit photomasks / John M. Jerke, editor, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-43Off-site

  • NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials / edited by David E. Sawyer and Harry A. Schafft, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-58Off-site

  • Technical impediments to a more effective utilization of neutron transmutation doped silicon for high-power device fabrication / D. R. Myers, Electron Devices Division, Center for Electronics and Electronical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt Print. Off., 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-60Off-site

  • Metrology for submicrometer devices and circuits / W. Murry Bullis, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-61Off-site

  • Thermal resistance measurements on power transistors / Sherwin Rubin and Frank F. Oettinger, Electron Devices Division, Center for Electronics and Electrical Engineering, National Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by Supt. of Docs., U.S. Govt. Print. Off., 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-14Off-site

  • A FORTRAN program for calculating the electrical parameters of extrinsic silicon / R. D. Larrabee, W. R. Thurber, and W. M. Bullis.

    • Text
    • Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-63Off-site

  • The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon / W.R. Thurber [and others].

    • Text
    • Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-64Off-site

  • A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.

    • Text
    • Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-68Off-site

  • A FORTRAN program for calculating the electrical parameters of extrinsic silicon / R.D. Larrabee, W.R. Thurber, and W.M. Bullis.

    • Text
    • Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:P400-63Off-site

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