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Displaying 1-50 of 66 results for author "IEEE Computer Society. Test Technology Technical Committee."
Proceedings, International Test Conference, 1992.
- Text
- Altoona, PA : International Test Conference ; Piscataway, NJ : Additional copies can be ordered from IEEE Service Center, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text JSF 93-96 Offsite Bridging faults and IDDQ testing / [edited] by Yashwant K. Malaiya and Rochit Rajsuman.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text JSF 94-557 Offsite New frontiers in testing : International Test Conference, 1988, proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, D. C. / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee, and IEEE Philadelphia Section.
- Text
- Washington, D.C. : Computer Society Press of the IEEE, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSF 88-538 Offsite Proceedings, Third International Conference on the Economics of Design, Test, and Manufacturing : May 16-17, 1994, Austin, Texas / sponsored by IEEE Computer Society Technical Committee for Test Technology ; edited by Tony Ambler, Magdy Abadir.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text JBF 96-1100 Offsite ITC : International Test Conference 2000 : proceedings : October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA / sponsored by IEEE Computer Society Test Technology Technical Council, and IEEE Philadelphia Section.
- Text
- Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Text JSF 01-146 Offsite Proceedings International Test Conference 2002 / [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
- Text
- Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2002.
- 2002
- 1 Item
Item details Format Call Number Item Location Text JSF 03-93 Offsite ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA / sponsored by IEEE Computer Society Test Technology Technical Council, and IEEE Philadelphia Section.
- Text
- Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text JSF 02-141 Offsite Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
- Text
- Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text JSF 04-54 Offsite Proceedings : Board and system test track / International Test Conference 2003 ; [30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA ; sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
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- Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text JSF 05-139 Offsite ITC International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.
- Text
- Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2004.
- 2004
- 1 Item
Available Online
http://ieeexplore.ieee.org/servlet/opac?punumber=9526Item details Format Call Number Item Location Text JSF 05-516 Offsite Chip-to-system test concerns for the 90's ; digest of papers, 1991 IEEE VLSI Test Symposium, April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA / sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section ; [Mukund U. Modi, general chairperson].
- Text
- New York, NY : IEEE, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I325 1991g Off-site The Second International Workshop on Rapid System Prototyping : shortening the path from specification to prototype : Research Triangle Park, North Carolina, USA, June 11-13, 1991 / workshop chair, Kenneth P. Anderson ; program chair, Nick Kanapoulos ; proceedings editor, Nick Kanapoulos.
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- Los Alamitos, California : IEEE Computer Society Press, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 1991g Off-site First Asian Test Symposium (ATS'92) : proceedings : November 26-27, 1992, Hiroshima, Japan / sponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with Special Interest Group on Design Automation, Information Processing Society of Japan, Technical Group on Fault Tolerant Systems IEICI [i.e. IEICE], Japan Society for the Promotion of Science, 132nd Committee (Electron and Ion Beam Science and Technology) ; [Kozo Kinoshita, symposium chair ; Hideo Fujiwara, program committee chair].
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text TK7874 .A83 1992g Off-site Digest of papers : eleventh annual, 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey; sponsored by the IEEE Computer Society, Technical Committee--Test Technology, Philadelphia Section of the IEEE.
- Text
- [New York] : The Society : Institute of Electrical and Electronics Engineers, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I325 1993g Off-site Proceedings, the Fourth International Workshop on Rapid System Prototyping : shortening the path from specification to prototype : June 28-30, 1993, Research Triangle Park, North Carolina, USA / workshop chair, Kenneth R. Anderson ; program chair, Nick Kanopoulos ; proceedings editor, Nick Kanopoulos.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 1993g Off-site Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I334 1993g Off-site Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China / sponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with China Computer Federation (CCF) [and others].
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 1993 Off-site Proceedings, 12th IEEE VLSI Test Symposium : April 25-28, 1994, Cherry Hill, New Jersey / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section ; [general chair, Prab Varma].
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1994g Off-site The Fifth International Workshop on Rapid System Prototyping : proceedings, June 21-23, 1994, Grenoble, France : shortening the path from specification to prototype / proceedings editor, Nick Kanopoulos ; sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, Association for Computing Machinery SIGSIM.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 1994g Off-site Records of the IEEE International Workshop on Memory Technology, Design and Testing, August 8-9, 1994, San Jose, California / edited by R. Rajsuman ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, in cooperation with the IEEE Computer Society Technical Committee on VLSI.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1994g Off-site Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan / sponsored by IEEE Computer Society Test Technology Technical Committee in cooperation with Technical Group on Fault Tolerant Systems (IEICE) [and others].
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 1994 Off-site 13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1995 Off-site Sixth IEEE International Workshop on Rapid System Prototyping, June 7-9, 1995, Chapel Hill, North Carolina : proceedings : shortening the path from specification to prototype / proceedings editor, Rudy Lauwereins ; sponsored by the IEEE Computer Society Technical Committee on Design Automation, the IEEE Computer Society Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 1995g Off-site Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 1995, San Jose, California / edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI in cooperation with the IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1995g Off-site Proceedings of the Fourth Asian Test Symposium, November 23-24, 1995, Bangalore, India / sponsored by IEEE Computer Society's Technical Committee on Test Technology, and the VLSI Society of India (VSI).
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 1995 Off-site Third International Conference on the Economics of Design, Test, and Manufacturing, May 16-17, 1994, Austin, Texas : proceedings / sponsored by IEEE Computer Society Technical Committee for Test Technology ; edited by Tony Ambler, Magdy Abadir.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7867 .I53 1994g Off-site Proceedings, 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1996g Off-site Seventh IEEE International Workshop on Rapid System Prototyping : shortening the path from specification to prototype, June 19-21, 1996, Thessaloniki, Greece / sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIM.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 1996g Off-site Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, DC / edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.M44 I34 1996g Off-site Proceedings of the Fifth Asian Test Symposium : ATS '96 : November 20-22, 1996, Hsinchu, Taiwan / sponsored by the IEEE Computer Society Technical Committee on Test Technology -- Asia Subcommittee, National Tsing Hua University.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 1996 Off-site 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California : proceedings / sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1997g Off-site 8th IEEE International Workshop on Rapid System Prototyping : shortening the path from specification to prototype, June 24-26, 1997, Chapel Hill, North Carolina, USA / sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 1997g Off-site Proceedings : International Workshop on Memory Technology, Design, and Testing / edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1997g Off-site IDDQ testing : digest of papers : IEEE International Workshop on IDDQ Testing, November 5-6, 1997, Washington, D.C. / edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.M44 I34 1997g Off-site Proceedings [of the] Sixth Asian Test Symposium : (ATS'97) : November 17-19, 1997, Akita, Japan / sponsored by the IEEE Computer Society, Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE [and others].
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 1997g Off-site Ninth International Workshop on Rapid System Prototyping : Jnue 3-5, 1998, Leuven, Belgium / sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIM ; proceedings editor: Jürgen Becker, program chair: Manfred Glesner, workshop chair: Rudy Lauwereins.
- Text
- Los Alamitos, Calif. : IEEE Computer Society, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 1998g Off-site 16th IEEE VLSI Test Symposium : proceedings : April 26-30, 1998, Monterey, California / sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section.
- Text
- Los Alamitos, California : IEEE Computer Society Press, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1998g Off-site Proceedings [of the] Seventh Asian Test Symposium : (ATS'98) : December 2-4, 1998, Singapore / sponsored by the IEEE Computer Society Test Technology Technical Committee [and others].
- Text
- Los Alamitos, California : IEEE Computer Society Press, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 1998g Off-site Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore / edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1996g Off-site IEEE International Workshop on Rapid Systems Prototyping : proceedings : June 16-18, 1999, Clearwater, Florida, USA / sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, Association for Computing Machinery SIGSIM.
- Text
- Los Alamitos, California : IEEE Computer Society, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 1999g Off-site Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA / edited by R. Rajsuman and T. Wik ; sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, in cooperation with the IEEE Solid-State Circuits Society.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 I335 1999g Off-site Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 1-3, 1999, Albuquerque, New Mexico / sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council.
- Text
- Los Alamitos, California : IEEE Computer Society Press, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I177 1999g Off-site Proceedings, Eighth Asian Test Symposium : (ATS'99) : November 16-18, 1999, Shanghai, China / sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) [and others].
- Text
- Los Alamitos, California : IEEE Computer Society Press, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 1999g Off-site Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France / Bernard Courtois [and others], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, CNRS-INPG-UJF (France) in cooperation with IEEE Computer Society Test Technology Technical Committee.
- Text
- Bellingham, Wash., USA : SPIE, [1999], ©1999.
- 1999-1999
- 2 Items
Item details Format Call Number Item Location Text TK7874 .D4757 1999g v.1 Off-site Item details Format Call Number Item Location Text TK7874 .D4757 1999g v.2 Off-site Eleventh IEEE international workshop on rapid system prototyping, June 21-23, 2000, Paris, France : proceedings : shortening the path from specification to prototype / ; sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 2000g Off-site 2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings / sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon.
- Text
- Los Alamitos, Calif. : IEEE Computer Society, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.M44 I34 1999g Off-site Proceedings, 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : October 25-27, 2000, Yamanashi, Japan / sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test TechnologyTechnical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE, Japan.
- Text
- Los Alamitos : IEEE Computer Society Press, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I177 2000g Off-site Proceedings of the ninth Asian Test Symposium : (ATS 2000) : December 4-6, 2000 Taipei, Taiwan / sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) ; co-sponsored by National Cheng-Kung University.
- Text
- Los Alamitos, California : IEEE Computer Society, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TK7888.4 .A85 2000g Off-site 19th IEEE VLSI Test Symposium : proceedings : April 29-May 3, 2001, Marina Del Rey, California, USA / sponsored by the IEEE Computer Society Test Technology Technical Council.
- Text
- Los Alamitos, California : IEEE, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 2001g Off-site 12th International Workshop on Rapid System Prototyping : RSP 2001, proceedings, June 25-27, 2001, Monterey, California / ; sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Simulation.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text QA76.9.S88 I577 2001g Off-site
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