Research Catalog

  • Dielectric films on gallium arsenide / W.F. Croydon and E.H.C. Parker.

    • Text
    • New York : Gordon and Breach, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 84-458Offsite
  • Proceedings of the Symposium on Dielectric Films on Compound Semiconductors / edited by Vik J. Kapoor, Denis J. Connolly, Y.H. Wong ; [co-sponsored by] Dielectrics and Insulation ad Electronics Divisions.

    • Text
    • Pennington, NJ (10 S. Main St., Pennington 08534-2896) : Electrochemical Society, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-736Offsite
  • Electron beam induced damage in PECVD Si₃N₄ and SiO₂ films on InP [microform] / Dragan M. Pantic ... [et al.] ; presented at the Dielectric Films on Compound Semiconductors Symposium sponsored by the Electrochemical Society, Honolulu, Hawaii, October 18-23, 1987.

    • Text
    • [Washington, D.C.] : NASA ; Springfield, Va. : For sale by the National Technical Information Service, [1990]
    • 1990
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS69699
  • Effective dielectric passivation scheme in area-selective front/back Poly-Si/SiOx passivating contact solar cells / Kejun Chen [and six others].

    • Text
    • [Golden, Colo.] : National Renewable Energy Laboratory, 2021.
    • 2021
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo176012
  • Process, equipment, and materials control in integrated circuit manufacturing : 25-26 October 1995, Austin, Texas / Anant G. Sabnis, Ivo J. Raaijmakers, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEMI--Semiconductor Equipment and Materials International.

    • Text
    • Bellingham, Wash., USA : SPIE, [1995], ©1995.
    • 1995-1995
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .P76 1995gOff-site
  • Process, equipment, and materials control in integrated circuit manufacturing II : 16-17 October 1996, Austin, Texas / Armando Iturralde, Te-Hua Lin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International [and others].

    • Text
    • Bellingham, Wash., USA : SPIE, [1996], ©1996.
    • 1996-1996
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .P76 1996gOff-site
  • Process, equipment, and materials control in integrated circuit manufacturing III : 1-2 October, 1997, Austin, Texas / Abe Ghanbari, Anthony J. Toprac, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, the Electrochemical Society.

    • Text
    • Bellingham, Washington : SPIE, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .P76 1997gOff-site
  • Amorphous and crystalline insulating thin films--1996 : symposium held December 2-4, 1996, Boston, Massachusetts, U.S.A. / editors, William L. Warren [and others].

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.15.F5 A45 1997Off-site
  • Multilevel interconnect technology II : 23-24 September, Santa Clara, California / Mart Graef, Divyseh N. Patel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, Solid State Technology [and others].

    • Text
    • Bellingham, Washington : SPIE, [1998], ©1998.
    • 1998-1998
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874.75 .M85 1998Off-site
  • Process, equipment, and materials control in integrated circuit manufacturing IV : 22-24 September, 1998, Santa Clara, California / Anthony J. Toprac, Kim Dang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, Solid State Technology [and others].

    • Text
    • Bellingham, Washington : SPIE, [1998], ©1998.
    • 1998-1998
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .P7519 1998Off-site
  • Process, equipment, and materials control in integrated circuit manufacturing V : 22-23 September, 1999, Santa Clara, California / Anthony J. Toprac, Kim Dang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Electrochemical Society [and others].

    • Text
    • Bellingham, Wash., USA : SPIE, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .P76 1999gOff-site
  • Multilevel interconnect technology III : 22-23 September 1999, Santa Clara, California / Mart Graef, Divyesh N. Patel, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Electrochemical Society [and others].

    • Text
    • Bellingham, Wash., USA : SPIE, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874.75 .M85 1999 Off-site
  • Thin films on glass / Hans Bach, Dieter Krause, editors.

    • Text
    • Berlin ; New York : Springer, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TK7872.T55 T456 1997Off-site
  • Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29- December 1, 1999, Boston, Mass., USA / editors D.A. Buchanan [and others].

    • Text
    • Warrendale, Pa. : Materials Research Society, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text QC585.75.S55 S76 2000Off-site
  • Materials, technology, and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A / editors, G.S. Oehrlein [and others].

    • Text
    • Warrendale, Pa. : Materials Research Society, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .M36783 2001Off-site
  • Materials, technology and reliability for advanced interconnects and low-k dielectrics--2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A / editors: Andrew J. McKerroe ... [et al.].

    • Text
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .M3454 2003gOff-site
  • Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 13-15 2004, San Francisco, California, U.S.A. / editors, R.J. Carter [and others].

    • Text
    • Warrendale : Materials Research Society, 2004.
    • 2004
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .M36783 2004gOff-site
  • The classical and quantum dynamics of the multispherical nanostructures / Gennadiy Burlak.

    • Text
    • London : Imperial College Press ; Hackensack, NJ : Distributed by World Scientific Pub., [2004], ©2004.
    • 2004-2004
    • 1 Item
    FormatCall NumberItem Location
    Text QC176.8.N35 B87 2004gOff-site
  • Materials, technology and reliability for advanced interconnects--2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A / editors: Paul R. Besser [and others].

    • Text
    • Warrendale, Pa. : Materials Research Society, [2005], ©2005.
    • 2005-2005
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .M3454 2005gOff-site
  • Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A. / editors Ting Y. Tsui [and others].

    • Text
    • Warrendale, Pennsylvania : Materials Research Society, 2006.
    • 2006
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .M36783 2006gOff-site
  • Dielectric films for advanced microelectronics / edited by Mikhail Baklanov, Martin Green, and Karen Maex.

    • Text
    • Chichester, England ; Hoboken, NJ : John Wiley & Sons, [2007], ©2007.
    • 2007-2007
    • 2 Items
    FormatCall NumberItem Location
    Text Off-site
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text TK7871.15.F5 D54 2007Off-site
  • Proceedings of the Symposium on Dielectric Films on Compound Semiconductors / edited by Vik J. Kapoor, Denis J. Connolly, Y.H. Wong ; [co-sponsored by] Dielectrics and Insulation ad Electronics Divisions.

    • Text
    • Pennington, NJ (10 S. Main St., Pennington 08534-2896) : Electrochemical Society, [1986], ©1986.
    • 1986-1986
    • 1 Item
    FormatCall NumberItem Location
    Text QC611.8.C64 S96 1985Off-site
  • Proceedings of the Symposium on Dielectric Films on Compound Semiconductors / edited by Vik J. Kapoor ; [sponsored by the] Dielectrics and Insulation and Electronics divisions.

    • Text
    • Pennington, NJ (10 S. Main St., Pennington 08534-2896) : Electrochemical Society, [1988], ©1988.
    • 1988-1988
    • 1 Item
    FormatCall NumberItem Location
    Text QC611.8.C64 S96 1988Off-site
  • Dielectric layers in semiconductors : novel technologies and devices : 1986 : XII : June 17th-20th 1986, Strasbourg (France) / edited by G.G. Bentini.

    • Text
    • Les Ulis, France : Editions de physique, [c1986]
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text TA401.3 .E9 vol. 12Off-site
  • Dielectric films on gallium arsenide / W.F. Croydon and E.H.C. Parker.

    • Text
    • New York : Gordon and Breach, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.15.G3 C76Off-site
  • Process, equipment, and materials control in integrated circuit manufacturing II : 16-17 October 1996, Austin, Texas / Armando Iturralde, Te-Hua Lin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International [and others].

    • Text
    • Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .P762 vol.2876Off-site
  • Dielectric films on gallium arsenide / W.F. Croydon and E.H.C. Parker.

    • Text
    • New York : Gordon and Breach, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.15.G3 C76Off-site
  • Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas, 14-16 June 2004 / editors, Paul S. Ho [and others].

    • Text
    • Melville, N.Y. : American Institute of Physics, 2004.
    • 2004
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .S768 2004Off-site
  • Microelectronics technology and process integration : 20-21 October 1994, Austin, Texas / Fusen E. Chen, Shyam P. Murarka, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M529 1994Off-site

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