Research Catalog
New! Try our Article Search to discover online journals, books, and more from home with your library card.
Selected filters.Clear Filters
Displaying 1-50 of 52 results for author "Institute of Electrical and Electronics Engineers. Philadelphia Section."
Digest of papers.
- Text
- New York, Institute of Electrical and Electronics Engineers.
- 197-1978
- 4 Items
Item details Format Call Number Item Location Text JSP 79-42 1976 Offsite Item details Format Call Number Item Location Text JSP 79-42 1977 Offsite Item details Format Call Number Item Location Text JSP 79-42 1978 Offsite LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey / sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text JSF 83-273 Offsite Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 / sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text JSF 83-274 Offsite Proceedings : Symposium on Small Computers in the Arts.
- Text
- Los Angeles, CA : IEEE Computer Society Press, 1981-
- 1981-present
- 4 Items
Item details Format Call Number Item Location Text JSP 83-110 Library has: 1982- 1983 Offsite Item details Format Call Number Item Location Text JSP 83-110 Library has: 1982- 1984 Offsite Item details Format Call Number Item Location Text JSP 83-110 Library has: 1982- 1985 Offsite Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
- Text
- Silver Spring, MD : IEEE Computer Society Press, 1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSF 84-138 Offsite Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 / sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
- Text
- Los Angeles, CA (P.O. Box 80452, Los Angeles 90080) : The Society, c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSF 83-572 Offsite Proceedings, Symposium on Small Computers in the Arts : November 20-22, 1981, Philadelphia, Pennsylvania / sponsored by IEEE Computer Society and IEEE Philadelphia Section.
- Text
- New York, NY : Institute of Electrical and Electronics Engineers ; Los Angeles, CA : IEEE Computer Society Press ; Los Angeles, CA : IEEE Computer Society [distributor] ; Piscataway, NJ : IEEE Service Center [distributor], c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text 3-MA 83-2813 Schwarzman Building - Art and Architecture Room 300 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
The three faces of test : design, characterization, production : International Test Conference, 1984 : proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
- Text
- Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSF 85-139 Offsite Testing's impact on design & technology : International Test Conference, 1986 proceedings, September 8, 9, 10, 11, 1986 / sponsored by the IEEE Computer Society, IEEE Philadelphia Section.
- Text
- Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSF 86-1238 Offsite 1986 IEEE Workstation Technology & Systems Conference : proceedings, Bally's Park Place Casino Hotel--Atlantic City, N.J. March 17-20, 1986 / IEEE Computer Society, The Institute of Electrical and Electronics Engineers, Computer Society Press [and] IEEE Philadelphia Section.
- Text
- Washington, D.C. : IEEE Computer Society Press, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSF 86-781 Offsite Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 / sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
- Text
- Washington, D.C. : IEEE Computer Society Press, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text JSF 88-918 Offsite Telecommunications freedom : technology on the move : 38th IEEE Vehicular Technology Conference, 15-17 June, 1988, Philadelphia, Pennsylvania / sponsored by the IEEE Vehicular Technology Society ; host, IEEE, Philadelphia Section.
- Text
- New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : IEEE Service Center [distributor], c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSF 94-673 Offsite New frontiers in testing : International Test Conference, 1988, proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, D. C. / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee, and IEEE Philadelphia Section.
- Text
- Washington, D.C. : Computer Society Press of the IEEE, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSF 88-538 Offsite ITC : International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA / sponsored by IEEE Computer Society Test Technology Technical Committee, and IEEE Philadelphia Section.
- Text
- Washington, DC : International Test Conference ; Piscataway New Jersey : IEEE, c1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text JSF 99-11 Offsite ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA / sponsored by IEEE Computer Society Test Technology Technical Committee, and IEEE Philadelphia Section.
- Text
- Washington, DC : International Test Conference ; Piscataway New Jersey : IEEE, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSF 99-847 Offsite ITC : International Test Conference 2000 : proceedings : October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA / sponsored by IEEE Computer Society Test Technology Technical Council, and IEEE Philadelphia Section.
- Text
- Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Text JSF 01-146 Offsite Proceedings International Test Conference 2002 / [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
- Text
- Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2002.
- 2002
- 1 Item
Item details Format Call Number Item Location Text JSF 03-93 Offsite ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA / sponsored by IEEE Computer Society Test Technology Technical Council, and IEEE Philadelphia Section.
- Text
- Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text JSF 02-141 Offsite Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
- Text
- Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text JSF 04-54 Offsite Proceedings of the 2004 IEEE Radar Conference : April 26 to April 29 Wyndham Philadelphia at Franklin Plaza, Philadelphia, Pennsylvania / sponsored by IEEE AES Society and Philadelphia Section of IEEE.
- Text
- Piscataway, N.J. : IEEE, c2004.
- 2004
- 1 Item
Available Online
http://ieeexplore.ieee.org/servlet/opac?punumber=9199Item details Format Call Number Item Location Text JSF 04-418 Offsite Proceedings : Board and system test track / International Test Conference 2003 ; [30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA ; sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
- Text
- Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text JSF 05-139 Offsite ITC International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.
- Text
- Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, c2004.
- 2004
- 1 Item
Available Online
http://ieeexplore.ieee.org/servlet/opac?punumber=9526Item details Format Call Number Item Location Text JSF 05-516 Offsite Chip-to-system test concerns for the 90's ; digest of papers, 1991 IEEE VLSI Test Symposium, April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA / sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section ; [Mukund U. Modi, general chairperson].
- Text
- New York, NY : IEEE, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I325 1991g Off-site Digest of papers : eleventh annual, 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey; sponsored by the IEEE Computer Society, Technical Committee--Test Technology, Philadelphia Section of the IEEE.
- Text
- [New York] : The Society : Institute of Electrical and Electronics Engineers, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I325 1993g Off-site Proceedings, 12th IEEE VLSI Test Symposium : April 25-28, 1994, Cherry Hill, New Jersey / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section ; [general chair, Prab Varma].
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1994g Off-site Proceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis : October 25-28, 1994, Philadelphia, Pennsylvania, USA / sponsored by the IEEE Signal Processing Society and the IEEE Philadelphia Section ; [Moeness G. Amin, general chair].
- Text
- [New York, NY] : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Available from IEEE Service Center, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TK5102.9 .I33 1994 Off-site 13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1995 Off-site IEEE conference record of 1969 ninth biennial Conference on Electric Process Heating in Industry : papers presented at the ninth biennial conference, Philadelphia, Pa., April 23-24, 1969 / sponsored by the IEEE Electric Process Heating Committee of the IEEE Industry and General Applications Group and the IEEE Philadelphia Section.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers, ©1969.
- 1969
- 1 Item
Item details Format Call Number Item Location Text TJ26 . C65 9th (1969) Off-site Proceedings, 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1996g Off-site 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California : proceedings / sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section.
- Text
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1997g Off-site Proceedings / Symposium on Small Computers in the Arts.
- Text
- Los Angeles, CA : IEEE Computer Society Press, 1981-
- 1981-present
- 5 Items
Item details Format Call Number Item Location Text NX260 .S96 v.3:1983 Off-site Item details Format Call Number Item Location Text NX260 .S96 v.4:1984 Off-site Item details Format Call Number Item Location Text NX260 .S96 v.5:1985 Off-site Digest of papers / International Test Conference.
- Text
- Los Angeles, CA : IEEE Computer Society Press, 1981-
- 1981-1982
- 2 Items
Item details Format Call Number Item Location Text TK7874 .I593 1981 Off-site Item details Format Call Number Item Location Text TK7874 .I593 1981 Off-site 16th IEEE VLSI Test Symposium : proceedings : April 26-30, 1998, Monterey, California / sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section.
- Text
- Los Alamitos, California : IEEE Computer Society Press, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I326 1998g Off-site Proceedings / International Test Conference.
- Text
- Silver Spring, Md. : IEEE Computer Society Press, 1983-
- 1983-present
- 26 Items
Item details Format Call Number Item Location Text TK7874 .I6 2002 Off-site Item details Format Call Number Item Location Text TK7874 .I6 2003 Off-site Item details Format Call Number Item Location Text TK7874 .I6 2003 Off-site Conference record - / IEEE International Conference on Acoustics, Speech, and Signal Processing.
- Text
- New York : Institute of Electrical and Electronics Engineers
- 1976-1979
- 4 Items
Item details Format Call Number Item Location Text TK7882.S65 I33 1977 Off-site Item details Format Call Number Item Location Text TK7882.S65 I33 1978 Off-site Item details Format Call Number Item Location Text TK7882.S65 I33 1979 Off-site Digest of papers ... Semiconductor Test Symposium.
- Text
- New York : Institute of Electrical and Electronics Engineers, 1974-1977.
- 1974-1977
- 4 Items
Item details Format Call Number Item Location Text TK7874 .S42 1975 Off-site Item details Format Call Number Item Location Text TK7874 .S42 1976 Off-site Item details Format Call Number Item Location Text TK7874 .S42 1977 Off-site Digest of papers ... Semiconductor Test Conference.
- Text
- New York : Institute of Electrical and Electronics Engineers, 1978.
- 1978-1978
- 1 Item
Item details Format Call Number Item Location Text TK7874 .S42 1978 Off-site Digest of technical papers / IEEE International Solid-State Circuits Conference.
- Text
- New York, N.Y. : Lewis Winner, 1959-
- 1959-present
- 40 Items
Item details Format Call Number Item Location Text TK7870 .In8 v.45 (2002) Off-site Item details Format Call Number Item Location Text TK7870 .In8 v.46 (2003) Off-site Item details Format Call Number Item Location Text TK7870 .In8 v.46 (2003) Off-site Intelligent robots and computer vision VIII : algorithms and techniques, 6-10 November 1989, Philadelphia, Pennsylvania / David P. Casasent, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University, IEEE Philadelphia Section, The Industrial Electronics Society of the IEEE.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1990], ©1990.
- 1990-1990
- 2 Items
Item details Format Call Number Item Location Text TJ210.3 .I574 1990g v.1 Off-site Item details Format Call Number Item Location Text TJ210.3 .I574 1990g v.2 Off-site Intelligent control and adaptive systems : 7-8 November 1989, Philadelphia, Pennsylvania / Guillermo Rodriguez, chair/editor ; sponsored by SPIE--The International Society for Optical Engineering ; cooperating organizations, IEEE Philadelphia Section, The Industrial Electronics Society of the IEEE, Center for Optical Data Processing/Carnegie Mellon University.
- Text
- Bellingham, Wash., USA : SPIE--The International Society for Optical Engineering, [1990], ©1990.
- 1990-1990
- 1 Item
Item details Format Call Number Item Location Text TJ217 .I583 1990g Off-site Automated inspection and high-speed vision architectures III : 6-7 November 1989, Philadelphia, Pennsylvania / Michael J.W. Chen, chair/editor ; sponsored by SPIE--The International Society for Optical Engineering ; cooperating organizations, IEEE Philadelphia Section, The Industrial Electronics Society of the IEEE, Center for Optical Data Processing/Carnegie Mellon University.
- Text
- Bellingham, Wash., USA : SPIE--The International Society for Optical Engineering, [1990], ©1990.
- 1990-1990
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A894 1990g Off-site VLSI system test, cost versus quality : 1990 IEEE VLSI Test Symposium April 10-11, 1990, Bally's Park Place Casino Hotel, Atlantic City, NJ / IEEE Philadelphia Section, IEEE Computer Society, Test Technology Committee.
- Text
- Atlantic City, NJ : IEEE Computer Society, 1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I325 1990g Off-site Testing to integrate semiconductor memories into computer mainframes : digest of papers ; Cherry Hill, New Jersey, October 4, 1972 / sponsored by the IEEE Computer Society Mideastern Area Committee and the Philadelphia Chapter of the Institute for Electrical and Electronics Engineers, Inc.
- Text
- New York : Institute of Electrical and Electronics Engineers, c1973.
- 1973
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 T47 Off-site Digest of technical papers. [Editor: Lewis Winner]
- Text
- New York, L. Winner, 1966.
- 1966
- 1 Item
Item details Format Call Number Item Location Text TK6175 91 1966 Off-site Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 / sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text TK7874 .T45 1980 Off-site Proceedings, 2nd Symposium on Small Computers in the Arts : October 15-17, 1982, Philadelphia, Pennsylvania / sponsored by IEEE Computer Society and IEEE Philadelphia Section.
- Text
- Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text NX260 .S96 1982 Off-site Memory & LSI : digest of papers / 1976 Semiconductor Test Symposium, October 19-21, 1976, held at Cherry Hill, New Jersey ; sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
- Text
- New York : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text TK7874.S42 1976 Off-site Proceedings, 3rd Symposium on Small Computers in the Arts : October 14-16, 1983, Philadelphia, Pennsylvania / sponsored by IEEE Computer Society and IEEE Philadelphia Section.
- Text
- Silver Spring, Md. : IEEE Computer Society Press ; Los Angeles, Calif. : Order from IEEE Computer Society, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text NX260 .S96 1983 Off-site The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
- Text
- Silver Spring, MD : IEEE Computer Society Press, ©1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I593 1984 Off-site 1986 IEEE Workstation Technology & Systems Conference : proceedings, Bally's Park Place Casino Hotel--Atlantic City, N.J. March 17-20, 1986 / IEEE Computer Society, IEEE Philadelphia Section.
- Text
- Washington, D.C. : IEEE Computer Society Press, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text QA76.5 .I27 1986 Off-site
No results found from Digital Research Books Beta
Digital books for research from multiple sources world wide- all free to read, download, and keep. No Library Card is Required. Read more about the project.
